2008
DOI: 10.1016/j.sna.2007.04.016
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Polarization sensitive optical coherence tomography for technical materials investigation

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Cited by 19 publications
(21 citation statements)
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“…In material studies OCT has been used mostly for the nondestructive testing of semiconductors [3], glass [4], composite materials, and plastic [5][6][7]. OCT and other techniques, such as white light interferometry, have also been used for metallic materials, for example, to determine their roughness [8].…”
Section: Introductionmentioning
confidence: 99%
“…In material studies OCT has been used mostly for the nondestructive testing of semiconductors [3], glass [4], composite materials, and plastic [5][6][7]. OCT and other techniques, such as white light interferometry, have also been used for metallic materials, for example, to determine their roughness [8].…”
Section: Introductionmentioning
confidence: 99%
“…1: Detector 1 and 3, Detector 2 and 4). In order to increase the signal to noise ratio, low noise balanced photodetectors have been used [14]. The OCT system features have been summarized in Table 1.…”
Section: Oct Measurement Systemmentioning
confidence: 99%
“…For this purpose, the OCT systems with additional functions have been developed. The main extensions enable the OCT Doppler analysis (D-OCT) [13], polarization sensitive (PS-OCT) [14][15][16][17][18][19][20] or expand the OCT measurements by wavelength dependent analysis of the device scattering or absorption features (SOCT) [21]. The other functional OCT systems which cannot be omitted, are Coherent Anti-Stokes Raman Scattering OCT (CARS-OCT) [22,23] and Coherent Stokes Raman Scattering OCT (CSRS-OCT) [23], Second Harmonic Generation OCT (SHG-OCT) [23], and Third Harmonic Generation OCT (THG-OCT) [23].…”
Section: Introductionmentioning
confidence: 99%
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