2016
DOI: 10.2493/jjspe.82.956
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Plasma-Enhanced Chemical Vapor Deposition

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“…The common features for almost TSV integration processes are as follows: 4,5) silicon wafer etching by a deep reactive ion etching (RIE), the deposition of an insulator liner on sidewalls customarily by the chemical vapor deposition (CVD) method, and the formation of a conductive layer which generally consists of the deposition of diffusion barrier metal and copper seed layer, and via filling though copper electroplating. Nowadays, these TSV key films are depending on plasmaenhanced CVD (PECVD), [6][7][8][9][10] physical vapor deposition (PVD), 11) atomic layer deposition (ALD) [12][13][14][15] and plasmaenhanced ALD (PEALD) [16][17][18] system. Those deposition methods are not able to answer the actual TSV needs.…”
Section: Introductionmentioning
confidence: 99%
“…The common features for almost TSV integration processes are as follows: 4,5) silicon wafer etching by a deep reactive ion etching (RIE), the deposition of an insulator liner on sidewalls customarily by the chemical vapor deposition (CVD) method, and the formation of a conductive layer which generally consists of the deposition of diffusion barrier metal and copper seed layer, and via filling though copper electroplating. Nowadays, these TSV key films are depending on plasmaenhanced CVD (PECVD), [6][7][8][9][10] physical vapor deposition (PVD), 11) atomic layer deposition (ALD) [12][13][14][15] and plasmaenhanced ALD (PEALD) [16][17][18] system. Those deposition methods are not able to answer the actual TSV needs.…”
Section: Introductionmentioning
confidence: 99%