The reaction chemistry during the
atomic layer deposition (ALD)
of Sc2O3 and Gd2O3 from
Sc(MeCp)3, Gd(iPrCp)3, and H2O was investigated by in situ time-resolved
quadrupole mass spectrometry. Despite the similarity of the ligands
of the Sc and Gd precursors, the growth characteristics and ligand
dissociation patterns of the Sc2O3 and Gd2O3 ALD processes showed considerably different
behavior. For both processes, the precursors reacted with the hydroxylated
surface by proton transfer and release of the protonated ligand. The
remaining ligands were then removed by hydrolysis during the H2O pulse. However, for the Sc(MeCp)3/H2O process, ∼56% of MeCpH was released during the Sc(MeCp)3 exposure, whereas in the case of the Gd(iPrCp)3/H2O process, as much as 90% of iPrCpH
was released during the Gd(iPrCp)3 pulse. The
observation that almost all iPrCp ligands were removed
during the initial Gd(iPrCp)3 absorption step
can be ascribed to CVD-like reactions between the Gd(iPrCp)3 precursor and excess hydroxide or physisorbed H2O on the hygroscopic Gd2O3 surface. The influence
of the growth temperature on the ligand exchange behavior and the
resulting film properties (thickness uniformity, impurity concentration)
was studied in the temperature range between 200 and 350 °C.
In addition, the transient growth behavior of Gd2O3 on Sc2O3 and vice versa was studied,
indicating that the hygroscopic nature of Gd2O3 also strongly influences the deposition of Gd
x
Sc1–x
O3 ternary
oxides.