2009
DOI: 10.1016/j.optmat.2008.09.012
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PL characterization of GaN scintillator for radioluminescence-based dosimetry

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Cited by 37 publications
(22 citation statements)
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“…The layer deposited at 1100 1C exhibits a strong luminescence with a maximum at 3.40 eV originating from band-edge transitions [35]. The asymmetric tail at higher wavelengths is related to shallow donors associated with oxygen impurities and defects.…”
Section: Resultsmentioning
confidence: 99%
“…The layer deposited at 1100 1C exhibits a strong luminescence with a maximum at 3.40 eV originating from band-edge transitions [35]. The asymmetric tail at higher wavelengths is related to shallow donors associated with oxygen impurities and defects.…”
Section: Resultsmentioning
confidence: 99%
“…GaN-based detectors are beneficial due to their capability to generate both the electrical and optical signals. The GaN-based detectors raise technical interest in development of the double-purpose devices capable to operate both as scintillating and charge collecting detectors for tracking of high-energy particles [7][8][9][10]. The depth and lateral homogeneity of the sensor structures are therefore necessary to get the linear response of the detector [11].…”
Section: Introductionmentioning
confidence: 99%
“…InGaN/GaN quantum well (QW) structures have been widely used for LEDs and lasers since early 1990s. More recently, the application of nitride heterostructures as fast scintillators for detectors of ionizing radiation have emerged . The advantages of nitride heterostructures compared to other scintillation materials are: high radiation resistance, high exciton binding energy, and consequently short luminescence decay time as well as high luminescence efficiency.…”
Section: Introductionmentioning
confidence: 99%