1986
DOI: 10.1063/1.96530
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Picosecond optical mixing in fast photodetectors

Abstract: We report a simple optical correlation technique which is capable of measuring the intrinsic response speeds of fast photosensitive electronic devices. The appeal of the method is that neither high-speed electrical connections to a device nor cross-correlation measurements between two devices are required. An example is given of measurements of the response speed of a GaAs Schottky barrier photodiode. Under appropriate illumination conditions the detector is found to be sufficiently fast to be capable of repla… Show more

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Cited by 43 publications
(12 citation statements)
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“…Another technique [48] to characterize the transient response of a photodetector makes use of the detector nonlinearity ( Fig. 13(d)).…”
Section: Structure and Packaging Considerationsmentioning
confidence: 99%
“…Another technique [48] to characterize the transient response of a photodetector makes use of the detector nonlinearity ( Fig. 13(d)).…”
Section: Structure and Packaging Considerationsmentioning
confidence: 99%
“…In this letter, we report the measurement of the intrinsic response time of MGM photodetectors with monolayer graphene, using an ultrafast optical correlation technique. 11 In contrast to a fully electronic approach, high-speed electronic equipment is not required. The experimental technique is based on the detection of the autocorrelation of ultrashort laser pulses with an MGM photodetector operated in a nonlinear regime.…”
mentioning
confidence: 99%
“…A limitation of the detector could hence not be determined. In this letter, we report the measurement of the intrinsic response time of MGM photodetectors with monolayer graphene, using an ultrafast optical correlation technique 11 . In contrast to a fully electronic approach, high-speed electronic equipment is not required.…”
mentioning
confidence: 99%
“…To back up the conclusions drawn above, a photocurrent autocorrelation measurement was conducted for the emitter module. Autocorrelation traces allow the extraction of the lifetime of the conduction carriers [28]. As it can be seen in Fig.…”
Section: Discussionmentioning
confidence: 99%