2017
DOI: 10.1016/j.apsusc.2017.01.194
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Picosecond laser registration of interference pattern by oxidation of thin Cr films

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Cited by 12 publications
(7 citation statements)
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“…Their studies were performed to understand the oxidation rate dynamics. Veiko et al [15] successfully oxidized chromium thin coatings using a picosecond laser with a fundamental wavelength of 1064 nm, confirming the formation of an oxide layer by Raman spectroscopic studies. They also report the formation of CrO2 state, which is difficult to detect using x-ray diffraction technique.…”
Section: Introductionmentioning
confidence: 88%
“…Their studies were performed to understand the oxidation rate dynamics. Veiko et al [15] successfully oxidized chromium thin coatings using a picosecond laser with a fundamental wavelength of 1064 nm, confirming the formation of an oxide layer by Raman spectroscopic studies. They also report the formation of CrO2 state, which is difficult to detect using x-ray diffraction technique.…”
Section: Introductionmentioning
confidence: 88%
“…To determine the thickness of the oxide layer H and its distribution over the film surface, we solved Equation (1) using the "equivalent time" method proposed earlier by Libenson, M.N. [35], which had numerous applications in our and other authors' works (for example, [24,[28][29][30][31][32][33][34]) for calculation of the dynamics of oxidation, taking into account the temperature distribution in the film at the heating T heat and cooling T cool stages for each pulse [34]:…”
Section: Setting the Simulation Problemmentioning
confidence: 99%
“…To determine the thickness of the oxide layer H and its distribution over the film surface, we solved Equation (1) using the “equivalent time” method proposed earlier by Libenson, M.N. [ 35 ], which had numerous applications in our and other authors’ works (for example, [ 24 , 28 , 29 , 30 , 31 , 32 , 33 , 34 ]) for calculation of the dynamics of oxidation, taking into account the temperature distribution in the film at the heating T heat and cooling T cool stages for each pulse [ 34 ]: where ρ me , c me , ρ ox , c ox , ρ S , and c S are the densities and heat capacities of the metal layer, oxide layer, and substrate, respectively; a S is the substrate thermal diffusivity; h and h me = ( h − H/υ PB ) are the thicknesses of the metal layer before and after laser action; υ PB is the Pilling–Bedworth coefficient, which equals the ratio of the molar volumes of the metal oxide and metal itself, 1.78 for Ti [ 36 ]; T in is the initial film temperature; q ( x ) is the spatial distribution of laser intensity along the transverse coordinate x , which was approximated by a sine function; τ is the laser pulse duration; A(x, H) is the film absorption, which was evaluated for each pulse using the optical matrices method (according to [ 37 ]) depending on the oxide layer thickness at the beginning of the pulse action. The heat transfer characteristic ( γ ) from the film to the substrate corresponds to: …”
Section: Laser Interference Patterningmentioning
confidence: 99%
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“…To create a stable, double-beam interference pattern in the focal plane, a laser beam was split by a phase grating, and two identical beams of the first interference order were subtracted by a spatial filter. Next, the beams were focused by the second lens creating an interference pattern at the intersection [27,28]. In the case of a confocal scheme, the angle between two beams is changed to manage the period of the pattern, which is determined as [29]:…”
Section: Laser Treatmentmentioning
confidence: 99%