2000
DOI: 10.1147/rd.444.0583
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Picosecond imaging circuit analysis

Abstract: Picosecond imaging circuit analysis A newly developed optical method for noninvasively measuring the switching activity of operating CMOS integrated circuit chips is described. The method, denoted as picosecond imaging circuit analysis (PICA) can be used to characterize the gate-level performance of such chips and identify the locations and nature of their operational faults. The principles underlying PICA and examples of its use are discussed.

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Cited by 67 publications
(24 citation statements)
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“…Integrated PICA systems are based on gated multi-channel plates with NIR-sensitive cathode materials. They were developed explicitly for failure analysis of semiconductors [98,172]. PICA delivers both spatial and very high temporal resolution, but offers only very limited NIR-sensitivity [98,172].…”
Section: Detection Techniquesmentioning
confidence: 99%
See 1 more Smart Citation
“…Integrated PICA systems are based on gated multi-channel plates with NIR-sensitive cathode materials. They were developed explicitly for failure analysis of semiconductors [98,172]. PICA delivers both spatial and very high temporal resolution, but offers only very limited NIR-sensitivity [98,172].…”
Section: Detection Techniquesmentioning
confidence: 99%
“…They were developed explicitly for failure analysis of semiconductors [98,172]. PICA delivers both spatial and very high temporal resolution, but offers only very limited NIR-sensitivity [98,172]. However, integrated PICA systems have a starting price of around 1,000,000 e. Since it is unlikely that these systems will ever become a commodity, this price will most probably not decrease within the next years.…”
Section: Detection Techniquesmentioning
confidence: 99%
“…PEM is reliable and the results are easy to interpret, but it is ineffective in diagnosing timing-related defects. Timing problems can be analyzed by a picosecond integrated circuit analyzer (PICA) [3,4]. The device is capable of acquiring timing information about internal nodes with a resolution of around 10 ps.…”
Section: Introductionmentioning
confidence: 99%
“…More precisely, the PICA sensor delivers the time and position of each photon emitted by the targeted circuit zone [16]. This technique has been initially developed to identify any functionality problem using temporal information during backside inspections [17].…”
Section: Introductionmentioning
confidence: 99%