Atomic Physics With Heavy Ions 1999
DOI: 10.1007/978-3-642-58580-7_2
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Physics at the Electron Beam Ion Trap

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Cited by 4 publications
(2 citation statements)
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“…Since its conception and realization in 1986 [50] the electron beam ion trap (EBIT) has contributed to the study of highly charged ions (HCI) in many ways [51]. The EBIT -a developmental 'spin-off'of an earlier device, the electron beam ion source (EBIS) [52] -was originally designed for in-situ X-ray spectroscopy with low density, high temperature plasmas.…”
Section: The Ebit-retrap Facilitymentioning
confidence: 99%
“…Since its conception and realization in 1986 [50] the electron beam ion trap (EBIT) has contributed to the study of highly charged ions (HCI) in many ways [51]. The EBIT -a developmental 'spin-off'of an earlier device, the electron beam ion source (EBIS) [52] -was originally designed for in-situ X-ray spectroscopy with low density, high temperature plasmas.…”
Section: The Ebit-retrap Facilitymentioning
confidence: 99%
“…Since its conception and realization in 1986 [22] the electron beam ion trap (EBIT) has contributed as an essential tool to the study of highly charged ions in many ways [23]. The EBIT -a spin-off device from the electron beam ion source (EBIS) [24] -was originally developed for in-situ x-ray spectroscopy on low density, high temperature plasmas.…”
Section: The Ebit-retrap Facilitymentioning
confidence: 99%