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2003
DOI: 10.1002/3527602313
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Physics and Chemistry of Interfaces

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Cited by 1,065 publications
(1,380 citation statements)
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“…In order to study the nano-scopic contact angle of a nanoscopic droplet [19], which could be observed, for example, using the atomic force microscope (AFM) [20], we have to include the thin film potential P (x). There are also the problem of line tension [21], which further modify the modified Cassie's law for the nanoscopic contact angle.…”
Section: Resultsmentioning
confidence: 99%
“…In order to study the nano-scopic contact angle of a nanoscopic droplet [19], which could be observed, for example, using the atomic force microscope (AFM) [20], we have to include the thin film potential P (x). There are also the problem of line tension [21], which further modify the modified Cassie's law for the nanoscopic contact angle.…”
Section: Resultsmentioning
confidence: 99%
“…Within this review, we focus on material and design aspects rather than colloidal physics, which has been exhaustively discussed elsewhere. [91][92][93][94] Figure 4. Overview of types of patterned structures that can be created from colloidal self-assembly processes.…”
Section: (D) Multiple Porositiesmentioning
confidence: 99%
“…(12), we employ here another evolution method on the same grid system, the lattice Poisson method (LPM) 24 (26) rv; rg where the equilibrium distribution of the electric potential evolution variable g is a=O a I to 6 (27) a=7tol4…”
Section: Fig 4 the Lattice Direction System (A) For D3q 15 Modelmentioning
confidence: 99%
“…Although it is well known that the electrokinetic flow is sensitive to the surface properties 26 , little attention has been paid to the effects of surface roughness on electrokinetic transport due to its complexity, especially for random roughness in microchannels 27 • Dukhin and De~jaguin 28 may be the first ones who performed systematic theoretical studies on roughness effects on electrokinetic flows. They introduced two critical length scales to characterize the problem: the Debye length which is defined as the thickness of the electrical double layer, and the charactertistic length of surface roughness.…”
Section: Introductionmentioning
confidence: 99%
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