2003
DOI: 10.1016/s0379-6779(02)00626-4
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Physical properties of conducting polymer nanofibers

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Cited by 23 publications
(16 citation statements)
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“…Consequently, there are many methods for measuring mechanical properties by AFM. The most common approach is to move the cantilever perpendicular to the plane of the substrate with the measured cantilever deflection providing normal force such as nanoindentation 42,43 or bending of a horizontally suspended nanofibre [44][45][46][47][48][49] to determine the material's Young's modulus or yield strength. Breaking strength and elongation at break are usually not measurable when using this geometry because the vertical range of motion for most AFM's is limited to a few micrometres.…”
Section: Introductionmentioning
confidence: 99%
“…Consequently, there are many methods for measuring mechanical properties by AFM. The most common approach is to move the cantilever perpendicular to the plane of the substrate with the measured cantilever deflection providing normal force such as nanoindentation 42,43 or bending of a horizontally suspended nanofibre [44][45][46][47][48][49] to determine the material's Young's modulus or yield strength. Breaking strength and elongation at break are usually not measurable when using this geometry because the vertical range of motion for most AFM's is limited to a few micrometres.…”
Section: Introductionmentioning
confidence: 99%
“…[2,5,7,11] Anisotropy in conducting polymers has been attributed to the influence of polymer morphology and orientation on the effective conjugation length and the rate of interchain charge transfer. [9,12] Several conduction mechanisms have been proposed for PEDOT, and ordering of polymer chains within a film ultimately determines which mechanism dominates. [1,13] Understanding and improving the conductivity of PEDOT has been complicated in part by the difficulty in controlling the nanoscale structural order of PEDOT films.…”
mentioning
confidence: 99%
“…34,35 Methods based on an AFM probe utilize either a cantilever-based arrangement where the load is applied to the end of a nanostructure, 22,36 or a simply supported arrangement where the load was applied to the middle section of the nanostructure supported over a micropore/microchannel. [14][15][16][18][19][20][36][37][38] Classical beam/ string mechanics is then employed to infer local deformations and estimate the nanomechanical properties. These techniques were further advanced by Yu et al 30 using a piezo-actuator in conjunction with AFM probe tips to nanomanipulate nanoscale specimens and use cantilever deflection to estimate the applied load.…”
Section: Introductionmentioning
confidence: 99%