2014
DOI: 10.1109/tthz.2014.2337655
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Physical Electro-Thermal Model for the Design of Schottky Diode-Based Circuits

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Cited by 21 publications
(13 citation statements)
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“…However, in order to accurately analyze and optimize the performances of high power multipliers, the thermal characteristics of Schottky diodes should be taken in to consideration. Over the last ten years, the introduction of self-consistent electrothermal model of Schottky diode multipliers has improved the designing procedures by analyzing the internal temperature distributions and offering useful information for circuit reliability and optimization [30]- [32]. The simulated performances based on electro-thermal exhibit better agreement with the measured results in previous researches [29], [30].…”
Section: Introductionmentioning
confidence: 79%
“…However, in order to accurately analyze and optimize the performances of high power multipliers, the thermal characteristics of Schottky diodes should be taken in to consideration. Over the last ten years, the introduction of self-consistent electrothermal model of Schottky diode multipliers has improved the designing procedures by analyzing the internal temperature distributions and offering useful information for circuit reliability and optimization [30]- [32]. The simulated performances based on electro-thermal exhibit better agreement with the measured results in previous researches [29], [30].…”
Section: Introductionmentioning
confidence: 79%
“…The excessive self‐heating phenomenon in the small junction areas certainly would lead to rapid performance degradation or even junction breakdown. In order to evaluate the self‐heating level of the diode as well as its impacts on circuit performances, electronic analysis of the circuit should be performed in cooperate with thermal simulations [ 6–9 ] .…”
Section: Architecture and Designmentioning
confidence: 99%
“…On the other hand, the estimated real‐time temperature at each anode should provide the variations in diode parameters including saturation current ( I s ), series impedance ( R s ) and ideality factor ( n ). Generally, the existing electro‐thermal model only provide the temperature properties of saturation current ( I s ), series impedance ( R s ) and ideality factor ( n ) based on some approximate temperature‐dependent factors and the original values of these parameters at the ambient temperature [ 6–14 ] . Pérez‐Moreno [ 14 ] utilized the original values including I s ( T nom ) and R s ( T nom ) obtained from physics‐based numerical simulations, which needs to know the details of the anode and requires high computational ability due to the microscopic insight into the device physics.…”
Section: Architecture and Designmentioning
confidence: 99%
“…In RF circuits, the interaction between electromagnetic waves and the semiconductor device is strongly nonlinear, which can hardly be solved by analytic methods. Hence, the circuit simulation is critical to analyze characteristics of RF circuits with semiconductor devices 1 . Compared with the equivalent circuit model‐based simulation method, 2 the physics‐based circuit simulation shows great advantages in analyzing the circuits over wide frequencies 3,4 and wide power ranges, 5,6 such as analyzing the Schottky diode terahertz frequency multipliers 3,4 and failure analysis of the ESD protection device 5 .…”
Section: Introductionmentioning
confidence: 99%