2003
DOI: 10.1016/s0168-9002(03)01512-2
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Physical analysis of the inverse problem of X-ray reflectometry

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Cited by 37 publications
(52 citation statements)
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“…Therefore, we did not add the calculated reflectivity curves to figure 1 for these cases. According to [20], we can conclude that the minimal feature size in the concentration profiles, which can still be reconstructed correctly, is about λ/(4 sin θ max ) ∼ 1 nm for our experiments, where θ max is the maximum measured angle.…”
Section: Reflectometrymentioning
confidence: 60%
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“…Therefore, we did not add the calculated reflectivity curves to figure 1 for these cases. According to [20], we can conclude that the minimal feature size in the concentration profiles, which can still be reconstructed correctly, is about λ/(4 sin θ max ) ∼ 1 nm for our experiments, where θ max is the maximum measured angle.…”
Section: Reflectometrymentioning
confidence: 60%
“…However, even for hard x-rays or neutrons, where radiation absorption can often be neglected, such reconstruction is ambiguous in the absence of additional a priori information about the sample [17][18][19][20].…”
Section: Reflectometrymentioning
confidence: 99%
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“…1). In this work, the ordering of the multilayer is studied within the model-independent approach to the reconstruction of profiles of the electron density from X-ray reflectometry data without any a priori assumptions on the structure of the multilayer [8][9][10][11][12]. According to our data, the characteristic time of formation of the structure of the surface is (1 − 7) × 10 5 s; after that, the lipid film can be considered as a two-dimensional organic crystal with a quite high degree of perfection We study multilayers of 1,2-distearoyl-sn-glycero-3-phosphoholine (DSPC) or C 44 H 88 NO 8 P [2].…”
mentioning
confidence: 99%