Photometric study of single-shot energy-dispersive x-ray diffraction at a laser plasma facility

Abstract

The low repetition rates and possible shot-to-shot variations in laser-plasma studies place a high value on single-shot diagnostics. For example, white-beam scattering methods based on broadband backlighter xray sources are used to determine changes in the structure of laser-shocked crystalline materials by the evolution of coincidences of reciprocal lattice vectors and kinematically-allowed momentum transfers.Here, we demonstrate that white-beam techniques can be extended to strongly-disordered dense plasma and warm dense matter (WDM) systems where reciprocal space is only weakly structured and spectroscopic detection is consequently needed to determine the static structure factor and thus the ionion radial distribution function. Specifically, we report a photometric study of energy-dispersive diffraction (ED-XRD) for structural measurement of high energy density systems at large-scale laser facilities such as OMEGA and the National Ignition Facility. We find that structural information can be obtained in single-shot ED-XRD experiments using established backlighter and spectrometer technologies.(*) Corresponding

Resonant inelastic X-ray scattering using a miniature dispersive Rowland refocusing spectrometer

“…the detected spectrum is at least a significant spatial average, loosening sample preparation homogeneity constraints. Operation of a Rowland circle spectrometer with an extended source on the Rowland circle has been discussed by Huotari et al (2011) and is common in plasma physics research (Glenzer et al, 2003;Glenzer & Redmer, 2009;Woolsey et al, 2011;Valdivia et al, 2018Valdivia et al, , 2015Suggit et al, 2010;Plateau et al, 2012;Matlis et al, 2006;Mao et al, 2012;Labate et al, 2012;Kritcher et al, 2011;Hudson et al, 2002;Hoidn & Seidler, 2014;Gamboa et al, 2012) where combined imaging and spectroscopy is achieved.…”

A color x-ray camera for 2–6 keV using a mass produced back illuminated complementary metal oxide semiconductor sensor

“…[1][2][3][4][5][6][7][8][9][10][11][12][13][14][15][16] Similar needs are also present in laser-plasma physics, where entire spectra for fluorescence, x-ray band thermal emission, or inelastic scattering must often be collected in few-pulse or even truly single-pulse experiments. [17][18][19][20][21][22][23][24][25][26][27][28][29][30][31][32][33][34] While there is an impressive effort aimed at either improvement of existing state-of-the-art technology or de novo development of new ideas for truly advanced highperformance detectors, [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15]…”