1975
DOI: 10.1016/0038-1098(75)90617-1
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Photoluminescence study of native defects in annealed GaAs

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Cited by 44 publications
(11 citation statements)
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“…Nevertheless a detailed comparison with our levels is not so easy. The b2 level (49 meV) for instance is observed in all TSC spectra with reproducible strength and is probably a structural defect; it can be compared with the 48 meV line reported by Chatterjee et al (1975) or Chang eta1 (1971) and attributed to the A, vacancy.…”
Section: Resultssupporting
confidence: 61%
“…Nevertheless a detailed comparison with our levels is not so easy. The b2 level (49 meV) for instance is observed in all TSC spectra with reproducible strength and is probably a structural defect; it can be compared with the 48 meV line reported by Chatterjee et al (1975) or Chang eta1 (1971) and attributed to the A, vacancy.…”
Section: Resultssupporting
confidence: 61%
“…The PL spectra taken below 100 K consist of the near band emission, conduction-band-to-Mn acceptor transitions and defect related luminescence. For example, intrinsic defects formed during the ion irradiation, like the optically active arsenic and gallium vacancies dominate the low temperature PL spectra [27,28]. The energy levels corresponding to those defects are located between 30 and 160 meV below the conduction band of GaAs and the low temperature PL emission peaks are located between 840 and 960 nm.…”
Section: A Optical Properties Of Mn Doped (Gamn)asmentioning
confidence: 99%
“…The LD sample also shows two lower-energy peaks that are red-shifted approximately 70 and 140 meV from the exciton emission peaks located at 1.47 and 1.40 eV, respectively, while the HD sample does not show these peaks in the CL spectra. Previous PL studies on single-crystalline GaAs materials have revealed an acceptor level C As defect relating to an ∼1.49 eV spectral peak and an acceptor Si As ∼1.48 eV with the main exciton peak at ∼1.51 eV, i.e., red-shifted 20–30 meV from the main exciton peak. The additional peaks in the CL spectra for the LD sample are red-shifted 70 and 140 meV from the main exciton peak; therefore, the Si As and C As peaks do not explain these peaks. These peaks could exist, but the large fwhm of the main exciton peak due to the Si doping could mask 20–30 meV shifted peaks if they are weak.…”
Section: Results and Discussionmentioning
confidence: 94%