2007
DOI: 10.1016/j.apsusc.2007.02.013
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Photoluminescence and Raman scattering of Cu-doped ZnO films prepared by magnetron sputtering

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Cited by 171 publications
(72 citation statements)
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“…The full width at half-maximum (FWHM) value of the undoped ZnO sample is 3.36 , which indicates excellent alignment of the nanorods perpendicular to the substrate surface. A very similar value of XRC FWHM was reported by Wang et al 37 for Cudoped ZnO films synthesized with magnetron sputtering. On the other hand, Yanmei et al 38 found a larger FWHM value of 10.4 for undoped ZnO in hydrothermal grown Ni:ZnO nanorods.…”
Section: Resultssupporting
confidence: 87%
“…The full width at half-maximum (FWHM) value of the undoped ZnO sample is 3.36 , which indicates excellent alignment of the nanorods perpendicular to the substrate surface. A very similar value of XRC FWHM was reported by Wang et al 37 for Cudoped ZnO films synthesized with magnetron sputtering. On the other hand, Yanmei et al 38 found a larger FWHM value of 10.4 for undoped ZnO in hydrothermal grown Ni:ZnO nanorods.…”
Section: Resultssupporting
confidence: 87%
“…All details of three stages of growth procedure can be found in [22,24]. ZnO thin films grown by magnetron sputtering method [26]. On the contrary, the study reported by Yanmei and co-workers showed that undoped ZnO nanorods had a larger FWHM value of 10.4° for hyrothermal synthesized ZnO:Ni samples [27].…”
Section: Methodsmentioning
confidence: 99%
“…The band at 384 nm is the UV near-band edge emission. 36,37 The other broad band, peaking at 440 nm, was attributed to the deep defect levels of oxygen vacancies or interstitial zinc ions. [38][39][40][41] Vendhausen et al 42 assigned the green emission at 510 nm to the transition between the photoexcited holes and singly ionized oxygen vacancy.…”
Section: Salah Et Almentioning
confidence: 99%