2007
DOI: 10.1143/jjap.46.2467
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Photodetective Characteristics of Metal–Oxide–Semiconductor Tunneling Structure with Aluminum Grid Gate

Abstract: We report measurements of the lifetimes of the 2 (−1,0) 0 n '2pnd'( 1 P o ) doubly excited states of helium with principal quantum number n ranging from 3 to 9. Our results are obtained using time-resolved single-photon detection of the VUV fluorescence emitted when the states decay following resonant excitation using VUV photons from a synchrotron light source beamline, and are compared with recent theoretical calculations.

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Cited by 2 publications
(2 citation statements)
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“…Hence, there was a second plateau of the photocurrent. A similar phenomenon was observed by Hashimoto et al [ 51 ].…”
Section: Mis Visible-to-near-ir Photodetectorssupporting
confidence: 88%
“…Hence, there was a second plateau of the photocurrent. A similar phenomenon was observed by Hashimoto et al [ 51 ].…”
Section: Mis Visible-to-near-ir Photodetectorssupporting
confidence: 88%
“…Under illumination, the accumulation of positive charge in the valence band at the Si 3 N 4 /Si top interface decreases the surface potential and increases the oxide voltage. The modified band diagrams shown by the red dotted lines in Figure 6c,d provide evidence of a reduced barrier resulting in enhanced tunneling [60]. This accounts for the steeper increase of the current under illumination observed for V < −6.5 V. In this voltage range, being normalV6EG/q, this is the threshold used in the Si one-sided junction for the avalanche breakdown when impact ionization might also occur, contributing to the photocurrent gain.…”
Section: Resultsmentioning
confidence: 99%