1997
DOI: 10.1109/3.644100
|View full text |Cite
|
Sign up to set email alerts
|

Photocurrents in a metal-semiconductor-metal photodetector

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
9
0

Year Published

2000
2000
2020
2020

Publication Types

Select...
7
2

Relationship

0
9

Authors

Journals

citations
Cited by 33 publications
(9 citation statements)
references
References 19 publications
0
9
0
Order By: Relevance
“…One‐dimensional calculations, based on the drift‐diffusion model 9–11, were used to study the transient and the steady state characteristics of the MSM‐PD under dark and illuminated conditions. However, because of the planar nature of the MSM structure, the electric field and current densities are two‐dimensional, and therefore 1D models remain unsatisfactory in studying the characteristics of the MSM‐PD.…”
Section: Introductionmentioning
confidence: 99%
“…One‐dimensional calculations, based on the drift‐diffusion model 9–11, were used to study the transient and the steady state characteristics of the MSM‐PD under dark and illuminated conditions. However, because of the planar nature of the MSM structure, the electric field and current densities are two‐dimensional, and therefore 1D models remain unsatisfactory in studying the characteristics of the MSM‐PD.…”
Section: Introductionmentioning
confidence: 99%
“…A pulsed laser with pulse width much less than the response time of the photodetector (<0.5 ps) illuminates the device. The photo-generated current I MSM (t) can be found by solving the continuity equation as in (Sarto and Zeghbroeck 1997). The solution is found by approximating the device in 1-D, which holds as long as the penetration depth δ of the incoming light is much less than the finger spacing L. The solution is the infinite series:…”
Section: Analytic Model For Photocurrentmentioning
confidence: 99%
“…2, this f tr reduction is observed on the Atlas simulation curve for L i greater than 2μm, when compared to the fast drift modeled curve that assumes full depletion of the I-region. In order to estimate the time t di f f for the diffusion of electrons through a P region of thickness L = L i − L zd , we can use the equation derived for a time-dependent sinusoidal electron density due to photogeneration in the P layer from the electron diffusion equation (Sarto& Zeghbroeck, 1997;Zimmermann, 2000) and, from there, derive the related -3dB frequency, Comparison of the PIN diode transition frequency given by Atlas simulations, by our model assuming drift only (full depletion hypothesis)(eq. 39), and by our model assuming both drift and diffusion mechanism (eq.…”
Section: Carrier Diffusionmentioning
confidence: 99%