DOI: 10.32469/10355/44173
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Photoacoustic evaluation of surfaces via pulsed evanescent field interaction

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Cited by 4 publications
(11 citation statements)
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References 116 publications
(183 reference statements)
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“…21 In this form, ( 0 ) represents the permittivity of free space, (c 0 ) is the speed of light in a vacuum, (ω) is the phase of the light, (x) is the horizontal position along the waveguide, and (λ 0 ) is the wavelength of the light in a vacuum. For a sufficiently thick cladding layer, these equations hold true and describe the intensity of the field within the cladding medium.…”
Section: Frustrated Total Internal Reflectionmentioning
confidence: 99%
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“…21 In this form, ( 0 ) represents the permittivity of free space, (c 0 ) is the speed of light in a vacuum, (ω) is the phase of the light, (x) is the horizontal position along the waveguide, and (λ 0 ) is the wavelength of the light in a vacuum. For a sufficiently thick cladding layer, these equations hold true and describe the intensity of the field within the cladding medium.…”
Section: Frustrated Total Internal Reflectionmentioning
confidence: 99%
“…21 At the surface of an ultrasonic detector, where x = 0, the equation describes the recorded amplitude of the pressure wave as a function of time. As the wave approaches the detector surface, the pressure exponentially increases in amplitude followed by an immediate drop when the wave hits the detector.…”
Section: Photoacousticsmentioning
confidence: 99%
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“…Many sources find it convenient to represent the Evanescent field in terms of irradiance, rather than Electric field intensity [91,144]. The relationship between Irradiance and the Electric field is derived from the Poynting vector, as shown below.…”
Section: Evanescent Fieldsmentioning
confidence: 99%
“…Consequently, the field extends into a third medium, where a percentage of the light is able to escape TIR and revert into a propagating photon within the third medium, as shown in Figure 3.9. This technique has been utilized in a variety of applications including prism couplers, optical filters and switches, biosensors, and in optically characterizing thin films [144,[146][147][148][149][150][151]. Moreover, it is also the basis upon which Photon Tunneling Microscopy functions [152].…”
Section: Frustrated Total Internal Reflectionmentioning
confidence: 99%