Characterization of MgF2 thin films using optical tunneling photoacoustic spectroscopy

Goldschmidt, Benjamin; Rudy, Anna M.; Nowak, Charissa A.; Macoubrie, Dylan; Viator, John A.; Hunt, Heather K.

doi:10.1016/j.optlastec.2015.04.019

Cited by 7 publications

(17 citation statements)

References 56 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…One such technique, Total Internal Reflection Photoacoustic Spectroscopy (TIRPAS), falls into the category of Evanescent Field-based Photoacoustics (EFPA) and has been demonstrated in the characterization of the thickness and refractive index of optically-transparent thin films [71]. Variations of the same technology have been suggested for use with metal and other optically-absorptive thin films, in the form of Surface Plasmon Resonance Photoacoustic Spectroscopy (SPRPAS) and Optical Tunneling Photoacoustic Spectroscopy (OTPAS), in addition to applications involving the detection of absorbing particles [38,72].…”

Section: Conclusion and Developing Technologiesmentioning

confidence: 99%

Techniques and Challenges for Characterizing Metal Thin Films with Applications in Photonics

2016

View full text Add to dashboard Cite

Abstract:The proliferation of laser technologies has profoundly increased the demand for high-quality optical thin films whose physical properties are tunable and well defined. Such films are frequently deposited in thicknesses much shorter than the wavelengths of visible light and consequently present challenges for characterization by traditional microscopy. Metal films in particular exemplify these challenges, due to their broad range of refractive indices, optical absorption and often near-complete reflectivity in the visible spectrum. However, due to their relatively consistent crystalline structure, the bulk optical properties of metal thin films are chiefly dependent on their thickness. This review therefore presents a compendium of viable alternative characterization techniques to highlight their respective utilities, limitations and resolutions, specifically with regard to the characterization of the thickness of metal films. Furthermore, this review explicitly addresses the operating theories, methods and analyses relating to the five most predominantly utilized techniques: X-ray Reflectivity (XRR), Spectroscopic Ellipsometry (SE), Atomic Force Microscopy (AFM), Scanning Electron Microscopy (SEM) and Energy-Dispersive X-ray Spectroscopy (EDS). This work is intended as an introductory guide to thin film characterization modalities and their applicability for metal and optically-absorptive films, while also identifying AFM and SEM/EDS as being amongst the more reliable of the techniques.

show abstract

Section: Conclusion and Developing Technologiesmentioning

confidence: 99%

Techniques and Challenges for Characterizing Metal Thin Films with Applications in Photonics

2016

View full text Add to dashboard Cite

show abstract

“…Advancements in the understanding of optical materials 1,3,4,6,7,10,[13][14][15][16] have provided new insights into the creation of thin film materials for a host of optical devices, including antireflection coatings on lenses, high extinction ratio optical filters, and highly absorbing slab waveguides 17 . These advancements would not be possible without the use of many characterization techniques, such as ellipsometry 4,6,18 , contact angle measurement, atomic force microscopy 7,11,19 , and scanning/transmission electron microscopy, which assist in the iterative improvement of these technologies by providing direct measures or indirect estimates of fundamental optical material properties.…”

Section: Introductionmentioning

confidence: 99%

“…These advancements would not be possible without the use of many characterization techniques, such as ellipsometry 4,6,18 , contact angle measurement, atomic force microscopy 7,11,19 , and scanning/transmission electron microscopy, which assist in the iterative improvement of these technologies by providing direct measures or indirect estimates of fundamental optical material properties. Said properties, such as the refractive index, govern how the materials interact with incident photons, which directly affects their function and their use in optical applications.…”

Section: Introductionmentioning

confidence: 99%

“…However, each of these techniques has limitations relating to resolution, sample preparation, cost, and complexity, and each generates only a subset of the data needed to fully characterize the material. That being said, a new set of techniques, known as evanescent field-based photoacoustics (EFPA) 5,6,15,18, as shown in Figure 1, has the potential to estimate material properties at the nanoscale in a consolidated set of experiments. EFPA encompasses the sub-techniques of total internal reflection photoacoustic spectroscopy (TIRPAS) 23,25,26,[33][34][35][43][44][45] , photoacoustic spectroscopy/total internal reflection photoacoustic spectroscopy refractometry (PAS/TIRPAS refractometry) /C p where α is the volume thermal expansion coefficient, v s is the speed of sound in the medium, and C p is the heat capacity at constant pressure, H 0 is the radiant exposure of the laser beam, c is the speed of sound in the excited medium, x is length, and t is time.…”

Section: Introductionmentioning

confidence: 99%

“…With such a small optical penetration depth, the evanescent field is able to interact with the environment very close to the interface of the two materials, and well below the optical and acoustic diffraction limits. The optical properties of materials or particles within this range may perturb the field or otherwise alter its generation, which interaction can be detected by a variety of methods 3,5,6,10,15,17,18,21,23,[25][26][27][29][30][31][32][33][34][35][36][37][38][39][40][41][42][43][44][45][46][47][84][85][86][87][88][89][90][91][92][93][94][95] .…”

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

Evanescent Field Based Photoacoustics: Optical Property Evaluation at Surfaces

Goldschmidt

Rudy

Nowak

et al. 2016

JoVE

Self Cite

View full text Add to dashboard Cite

Here, we present a protocol to estimate material and surface optical properties using the photoacoustic effect combined with total internal reflection. Optical property evaluation of thin films and the surfaces of bulk materials is an important step in understanding new optical material systems and their applications. The method presented can estimate thickness, refractive index, and use absorptive properties of materials for detection. This metrology system uses evanescent field-based photoacoustics (EFPA), a field of research based upon the interaction of an evanescent field with the photoacoustic effect. This interaction and its resulting family of techniques allow the technique to probe optical properties within a few hundred nanometers of the sample surface. This optical near field allows for the highly accurate estimation of material properties on the same scale as the field itself such as refractive index and film thickness. With the use of EFPA and its sub techniques such as total internal reflection photoacoustic spectroscopy (TIRPAS) and optical tunneling photoacoustic spectroscopy (OTPAS), it is possible to evaluate a material at the nanoscale in a consolidated instrument without the need for many instruments and experiments that may be cost prohibitive.

show abstract

Design and characterization of mechanically stable, nanoporous TiO2 thin film antimicrobial coatings for food contact surfaces

Dominguez

Nguyen

Hylen

et al. 2020

Materials Chemistry and Physics

View full text Add to dashboard Cite

Characterization of MgF2 thin films using optical tunneling photoacoustic spectroscopy

Cited by 7 publications

References 56 publications

Techniques and Challenges for Characterizing Metal Thin Films with Applications in Photonics

Techniques and Challenges for Characterizing Metal Thin Films with Applications in Photonics

Evanescent Field Based Photoacoustics: Optical Property Evaluation at Surfaces

Design and characterization of mechanically stable, nanoporous TiO2 thin film antimicrobial coatings for food contact surfaces

Contact Info

Product

Resources

About