2022
DOI: 10.1039/d2cs00052k
|View full text |Cite
|
Sign up to set email alerts
|

Photo-induced force microscopy (PiFM) – principles and implementations

Abstract: In photo-induced force microscopy (PiFM), a sharp atomic tip is illuminated by a tightly focused laser beam and the photo-induced force is measured through the changes in the oscillatory motion of the cantilever.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
33
0

Year Published

2022
2022
2024
2024

Publication Types

Select...
8
1

Relationship

0
9

Authors

Journals

citations
Cited by 46 publications
(39 citation statements)
references
References 51 publications
0
33
0
Order By: Relevance
“…Taking the AFM-IR mode as a more advanced example, this technique aims to characterize the photothermal absorption of the material by combining a laser source and the AFM. AFM-IR have two primary flavors including contact-mode photo-thermal induced resonance (c-PTIR) [ 13 ] and non-contact Photo-induced Force Microscopy (PiFM) [ 14 ]. A revised version for PTIR utilizes a pulsed laser at the resonance of the cantilever as resonance enhanced PTIR, which can be operated either in contact-resonance mode [ 15 ] or tapping mode [ 16 ].…”
Section: Afm Basic Principlesmentioning
confidence: 99%
“…Taking the AFM-IR mode as a more advanced example, this technique aims to characterize the photothermal absorption of the material by combining a laser source and the AFM. AFM-IR have two primary flavors including contact-mode photo-thermal induced resonance (c-PTIR) [ 13 ] and non-contact Photo-induced Force Microscopy (PiFM) [ 14 ]. A revised version for PTIR utilizes a pulsed laser at the resonance of the cantilever as resonance enhanced PTIR, which can be operated either in contact-resonance mode [ 15 ] or tapping mode [ 16 ].…”
Section: Afm Basic Principlesmentioning
confidence: 99%
“…Excellent review articles are available explaining the working principle of these methods in-depth. [89,90] As shown by ten Have et al, this so-called AFM-IR or nano-IR technique (specifically, the authors used PiFM) facilitates the accurate detection of PS NPs down to 20 nm in size. [65] The surface sensitivity highlighted a change of spectrum after H 2 O 2 treatment of the (commercially obtained) PS beads.…”
Section: Scanning Probe Microscopymentioning
confidence: 99%
“…4 The other family of methods, and an increasingly popular AFM-based infrared spectroscopy method for soft matters, is the AFM-IR, which mechanically detects the photothermal response of the sample due to IR absorption. Since its early conception and demonstration, 5,6 AFM-IR has been developed with different AFM operational modes: 7 the original photothermal induced resonance (PTIR) technique that is based on contact mode, 8,9 photo-induced force microscopy (PiFM), 10,11 or tapping AFM-IR, that is based on tapping mode, 9,12 and peak force infrared (PFIR) microscopy that is based on the peak tapping mode. 13,14 These AFM-IR techniques inherit the same advantages and limitations of their respective AFM operational modes.…”
Section: Introductionmentioning
confidence: 99%