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2006
DOI: 10.1103/physrevb.74.184302
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Phonon conductivity of plastically deformed crystals: Role of stacking faults and dislocations

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Cited by 26 publications
(29 citation statements)
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“…, consistent with the dynamic scattering results where the relaxation rate is independent of the Burgers vector b [16,19,36]. Eq.…”
supporting
confidence: 90%
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“…, consistent with the dynamic scattering results where the relaxation rate is independent of the Burgers vector b [16,19,36]. Eq.…”
supporting
confidence: 90%
“…All of the above DPI mechanisms dominate at very low temperature where anharmonic phonon-phonon interaction is weak. Dislocations may also reduce the thermal conductivity above the conductivity maximum temperature [13,16,36,37]. This is explained as contributions beyond the dislocation, such as dislocation dipoles [16] or stacking faults [36].…”
mentioning
confidence: 99%
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“…C in Equation ( 5) represents the phonon scattering parameter of stacking faults, which is in proportional to the number of stacking faults. [54,55] The resonant frequency of 1.48 THz, derived from the above C p analysis, is used for the fitting. The fitted κ L curve (red solid curve) agrees well with the experimental data (square symbols).…”
Section: Resultsmentioning
confidence: 99%
“…Several strategies to enhance zT include i) enhancing the TE power factor PF ( = S 2 / ) via energy filtering of charge carriers, [9,10] or introduction of resonance levels in the valence or conduction band to improve S, [11] and/or reduce (= 1/ ) through bandstructure engineering [12,13] and modulation doping, [14] and ii) reducing lat through phonon engineering. This can be achieved by the incorporation of point defects, [15] stacking faults, [16] dislocations, [17,18] vacancies, [19] nanostructuring, [20,21] nanocomposites, [22] secondary phase precipitates, [23] and phase separation techniques, [24] all resulting in enhanced phonon scattering. Low intrinsic lat is also attributed to phonon anharmonicity in single-crystalline SnSe, and is responsible for its promising TE properties.…”
Section: Introductionmentioning
confidence: 99%