A kinetic study of the solid-state polymerization of disulfur dinitride (S_~N2) to polysulfur nitride [(SN),] has been performed, combining monochromatic high-energy (~\ = 0.3263,~) synchrotron radiation X-ray powder diffraction, a large-area (o = 220 ram) CCD-based X-ray image-intensifier detector and Rietveld refinement. Recently developed techniques for detector calibration and reduction of two-dimensional images to one-dimensional diffraction patterns have been employed for data processing/analysis. Good fits were obtained after Rietveld refinement [Rp = 8.4%, wRp = 9.4%, sin(0.,,,~)/A = 0.585/~ 1] of diffraction patterns of S_~N_~ fiom images with 2 s exposure time. The solid-state polymerization of S2N_~ to (SN), was followed at a maximum rate of two diffraction images per minute. Scale factors and cell parameters for S,N~ and ,J-(SN), as functions o1" time were readily obtained after Rietveld refinement of the diffraction patterns obtained from each individual image throughout the polymerization. The polymerization was preceded by a lattice distortion of S2N~, and at 50% conversion the a axis had decreased by about 1% and the c axis had increased about 1%. The polymerization yielded not only the expected polymer ,~-(SN),, but also a small amount of a compound that could be another phase of (SN),.