Phase transformation properties of finite size ferroelectric thin film with structural transition zones

Abstract

By considering structural transition zones in the lateral and thickness directions of finite size ferroelectric thin film, phase transformation properties of the thin film are investigated based on a transverse Ising model. The influence of the lateral size of the thin film on the polarization and the Curie temperature has been quantified. Our results indicate that the lateral size of the film plays a crucial role in determining the phase transformation properties for a small size ferroelectric thin film.