Phase‐retrieved pupil function and coherent transfer function in confocal microscopy

Foreman, Matthew R.; Giusca, Claudiu; Török, Péter; Leach, Richard

doi:10.1111/jmi.12050

Cited by 12 publications

(6 citation statements)

References 31 publications

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“…This means that a method needs to be developed to extract the phase from the intensity data (the confocal planes). NPL is currently working on this difficult theoretical problem [44].…”

Section: Transfer Function Approachesmentioning

confidence: 99%

Calibration and verification of areal surface texture measuring instruments

Leach

Giusca

Haitjema³

et al. 2015

CIRP Annals

Self Cite

102

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“…This means that a method needs to be developed to extract the phase from the intensity data (the confocal planes). NPL is currently working on this difficult theoretical problem [44].…”

Section: Transfer Function Approachesmentioning

confidence: 99%

Calibration and verification of areal surface texture measuring instruments

Leach

Giusca

Haitjema³

et al. 2015

CIRP Annals

Self Cite

102

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“…The phase retrieval process makes use of images acquired with the optical system in question, and therefore inherently includes system specific aberrations. A realistic PSF computed from the retrieved pupil function has been used in 3D image deconvo-lution [19], and more recently, modified phase retrieval methods were investigated specifically for STED microscopy [20] and confocal microscopy [21].…”

Section: Introductionmentioning

confidence: 99%

Three dimensional single molecule localization using a phase retrieved pupil function

et al. 2013

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Localization-based superresolution imaging is dependent on finding the positions of individual fluorophores in a sample by fitting the observed single-molecule intensity pattern to the microscope point spread function (PSF). For three-dimensional imaging, system-specific aberrations of the optical system can lead to inaccurate localizations when the PSF model does not account for these aberrations. Here we describe the use of phase-retrieved pupil functions to generate a more accurate PSF and therefore more accurate 3D localizations. The complex-valued pupil function contains information about the system-specific aberrations and can thus be used to generate the PSF for arbitrary defocus. Further, it can be modified to include depth dependent aberrations. We describe the phase retrieval process, the method for including depth dependent aberrations, and a fast fitting algorithm using graphics processing units. The superior localization accuracy of the pupil function generated PSF is demonstrated with dual focal plane 3D superresolution imaging of biological structures.

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“…A rather theoretical approach for the prediction of transfer behavior is the instrument transfer function (ITF) as described by de Groot et al [27]. Further theoretical considerations have been summarized by Foreman et al [28].…”

Section: Introductionmentioning

confidence: 99%

Virtual topography measurement with transfer functions derived by fitted time series models

Keksel

Lohfink

Eifler

et al. 2020

Meas. Sci. Technol.

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The deviations between the actual geometry of a workpiece and the measured geometry are defined by the transfer function of the surface topography measuring instrument used. When the transfer characteristics of a measuring instrument are known, they can, for example, be used for the estimation of measuring results by performing virtual measurements and can subsequently be applied for the estimation of the measurement uncertainty. A technique that has been increasingly applied for the determination of the transfer function of topography measuring devices is the approach based on physical modeling. Here, mathematical models apply simplifications of the complex physical relationships to describe the transfer characteristics of measuring devices. Another method used in practice is the application of material measures for the direct measurement of transfer properties. Within this paper, an alternative approach developed by the authors that applies the ARMA model is further investigated and optimized with regard to its practical applicability. This model was described in a previous publication (Keksel et al 2018 Meas. Sci. Technol. 29 095012) and combines the advantages of theoretical modeling and the experimental determination of transfer characteristics. Within the present work, the approach is further optimized and it is demonstrated that the description of measuring devices by the ARMA model delivers reasonable results for various measuring principles that can be used for a precise virtual prediction of measurement results.

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Phase‐retrieved pupil function and coherent transfer function in confocal microscopy

Cited by 12 publications

References 31 publications

Calibration and verification of areal surface texture measuring instruments

Calibration and verification of areal surface texture measuring instruments

Three dimensional single molecule localization using a phase retrieved pupil function

Virtual topography measurement with transfer functions derived by fitted time series models

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