Phase-retardation and full-polarization analysis of soft-x-ray synchrotron radiation close to the carbon K edge by use of a multilayer transmission filter

Abstract

We have produced a multilayer transmission filter with 100 periods of Cr/C to achieve a significant phase retardation while maintaining good transmission for photon energies just below the carbon K edge. This device was installed into a polarimeter behind the SX700/3 monochromator at the Berlin synchrotron radiation laboratory, BESSY. The phase-retardation properties were observed as theoretically predicted. Agreement between experiment and calculation could be obtained by introduction of a rather small interface roughness in the simulation code (σ = 0.65 nm rms). An observed phase retardation of 5° was sufficient to permit, for the first time we believe, a complete and unambiguous polarization analysis of soft-x-ray synchrotron radiation (265-eV photon energy) with primary standards.

A detector for circular polarization of soft x rays

“…Below this energy range, multilayers acting as phase shifters have been used successfully. 8 Within this region, user experiments which are sensitive to circularly polarized light were employed to estimate the polarization degree 9 and to compare it with theoretical predictions, as recently demonstrated during characterization of the Elliptical Multipole Wiggler at the National Synchrotron Light Source ͑NSLS͒.…”

Mo/Si multilayer-coated amplitude-division beam splitters for XUV radiation sources

“…The ML structure is then deposited onto the coated Si substrate. The coated substrate in some cases has been etched from the back prior to the ML deposition leaving a window with a thin SiN or SiC membrane (30-890 nm) supporting a ML coating (Schä -fers et al, 1999;Khan Malek et al, 1989;Di Fonzo et al, 1994;Nguyen,1994;Da Silva et al, 1995b;Tinone et al, 1996;Wang et al, 2003Wang et al, , 2007. Sometimes this free membrane is coated on both sides (Zeitoun et al, 2004;Hubert et al, 2001;Smith et al, 2003).…”

Design of an apparatus for polarization measurement in soft X-ray region

“…In the energy range between 100 eV and 300 eV, polarization measurements have been performed by using a polarimeter or ellipsometer equipped with multilayer phase shifter and analyzer such as Mo/Si, Ru/Si and Cr/C [1][2][3][4]. Recently development of polarizing elements for use in the higher region has been progressed [5,6].…”