Phase resolved near-field mode imaging for the design of frequency-selective surfaces

Kinzel, Edward C.; Ginn, James; Olmon, Robert L.; Shelton, David; Lail, Brian A.; Brener, Igal; Sinclair, Michael B.; Raschke, Markus B.; Boreman, Glenn D.

doi:10.1364/oe.20.011986

Cited by 16 publications

(23 citation statements)

References 18 publications

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“…In current variants of s-SNOM, the reference field has to be varied at each pixel (for example, frequency shifted or phase modulated), to interferometrically obtain from I n (i) background-free and (ii) amplitude and phase-resolved near-field images for n >2 (refs 44, 45). To that end, technologically challenging techniques have been implemented, including heterodyne44464748, pseudo-heterodyne45 or phase shifting4950 interferometry.…”

Section: Resultsmentioning

confidence: 99%

Synthetic optical holography for rapid nanoimaging

2014

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Holography has paved the way for phase imaging in a variety of wide-field techniques, including electron, X-ray and optical microscopy. In scanning optical microscopy, however, the serial fashion of image acquisition seems to challenge a direct implementation of traditional holography. Here we introduce synthetic optical holography (SOH) for quantitative phase-resolved imaging in scanning optical microscopy. It uniquely combines fast phase imaging, technical simplicity and simultaneous operation at visible and infrared frequencies with a single reference arm. We demonstrate SOH with a scattering-type scanning near-field optical microscope (s-SNOM) where it enables reliable quantitative phase-resolved near-field imaging with unprecedented speed. We apply these capabilities to nanoscale, non-invasive and rapid screening of grain boundaries in CVD-grown graphene, by recording 65 kilopixel near-field images in 26 s and 2.3 megapixel images in 13 min. Beyond s-SNOM, the SOH concept could boost the implementation of holography in other scanning imaging applications such as confocal microscopy.

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Section: Resultsmentioning

confidence: 99%

Synthetic optical holography for rapid nanoimaging

2014

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“…1(a). 21,23 The patterns consist of arrays of loops or patches of the dimensions labeled in Fig. 1(a) that were arranged in a repeating arrangement of five elements of different sizes aligned in a row.…”

Section: Methodsmentioning

confidence: 99%

“…Specifically, this is accomplished by performing leastsquares, point-by-point fits with a cosine function to the set of phase images. 21 Line scan analysis of phase and AFM height measurements was performed using WSxM version 3.1. 29 …”

Section: -2mentioning

confidence: 99%

Near- and far-field measurements of phase-ramped frequency selective surfaces at infrared wavelengths

Tucker

D’Archangel

Raschke³

et al. 2014

Journal of Applied Physics

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Near- and far-field measurements of phase-ramped loop and patch structures are presented and compared to simulations. The far-field deflection measurements show that the phase-ramped structures can deflect a beam away from specular reflection, consistent with simulations. Scattering scanning near-field optical microscopy of the elements comprising the phase ramped structures reveals part of the underlying near-field phase contribution that dictates the far-field deflection, which correlates with the far-field phase behavior that was expected. These measurements provide insight into the resonances, coupling, and spatial phase variation among phase-ramped frequency selective surface (FSS) elements, which are important for the performance of FSS reflectarrays.

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“…And there has been great recent excitement in the field of high-resolution optical imaging [3][4][5]. Now, some researchers have begun to use the evanescent field for trapping nanoparticles, etc [6,7].…”

Section: Introductionmentioning

confidence: 99%

Local Field Enhancement Characteristics in a Tapered Metal-Coated Optical Fiber Probe for Nanolithography

Cui

Yang

Wang

et al. 2015

Integrated Ferroelectrics

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In the nanolithography, some exciting developments have been motivated by the tapered metal-coated optical fiber probe irradiated by ultra-fast pulse laser. To explore the related mechanism, the local field is studied using the finite element method in this paper. The simulation results show the reflection at the cut-off plane, edge enhancement effect and surface plasmon resonance become the major factors affecting the near-field. In addition, Based on the near-field distribution and characteristics, the new promising scheme is proposed for near-field nanolithography.

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Phase resolved near-field mode imaging for the design of frequency-selective surfaces

Cited by 16 publications

References 18 publications

Synthetic optical holography for rapid nanoimaging

Synthetic optical holography for rapid nanoimaging

Near- and far-field measurements of phase-ramped frequency selective surfaces at infrared wavelengths

Local Field Enhancement Characteristics in a Tapered Metal-Coated Optical Fiber Probe for Nanolithography

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