Phase measurement deflectometry with refraction model and its calibration

Li, Chen; Li, Youfu; Xiao, Yi; Zhang, Xu; Tu, Dawei

doi:10.1364/oe.26.033510

Cited by 34 publications

(15 citation statements)

References 21 publications

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“…In order to overcome the challenges in classical PMD, several different kinds of regularization approaches with corresponding setups for different requirements in actual measurement are proposed. [38][39][40][41][42][43][44][45][46][47][48] Some typical PMD establishments with additional components (such as screens or cameras) are shown in Fig. 3.…”

Section: Establishments Of Pmdmentioning

confidence: 99%

“…[38][39][40] However, movement of the LCD screen increases the instability and measurement time of the system. To resolve the ill-posed problems, Li et al 41 presented a simplified PMD system using a transparent screen and an LCD screen, avoiding the movement of the LCD screen. In Li's system, the two screens can be fixed in a relatively free position and the ray of camera can pass through the transparent screen to an LCD screen.…”

Section: Establishments Of Pmdmentioning

confidence: 99%

“…The refraction error model of LCD is also applicable to PMD systems. Li et al 41 proposed a phase measurement deflectometry incorporating with a refraction model to measure mirror surface. Because of the light propagation path is accurately determined by introducing the refraction model, the system measurement accuracy can be improved.…”

Section: Display Screenmentioning

confidence: 99%

See 2 more Smart Citations

Phase measuring deflectometry for obtaining 3D shape of specular surface: a review of the state-of-the-art

et al. 2021

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Phase measuring deflectometry (PMD) is a superior technique to obtain three-dimensional (3D) shape information of specular surfaces because of its advantages of large dynamic range, noncontact operation, full-field measurement, fast acquisition, high precision, and automatic data processing. We review the recent advances on PMD. The basic principle of PMD is introduced following several PMD methods based on fringe reflection. First, a direct PMD (DPMD) method is reviewed for measuring 3D shape of specular objects having discontinuous surfaces. The DPMD method builds the direct relationship between phase and depth data, without gradient integration procedure. Second, an infrared PMD (IR-PMD) method is reviewed to measure specular objects. Because IR light is used as a light source, the IR-PMD method is insensitive to the effect of ambient light on the measured results and has high measurement accuracy. Third, a proposed method is reviewed to measure the 3D shape of partial reflective objects having discontinuous surfaces by combining fringe projection profilometry and DPMD. Then, the effects of error sources that mainly include phase error and geometric calibration error on the measurement results are analyzed, and the performance of the 3D shape measurement system is also evaluated. Finally, the future research directions of PMD are discussed.

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Section: Establishments Of Pmdmentioning

confidence: 99%

Section: Establishments Of Pmdmentioning

confidence: 99%

See 1 more Smart Citation

Phase measuring deflectometry for obtaining 3D shape of specular surface: a review of the state-of-the-art

et al. 2021

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show abstract

“…However, screen movement increases complexity of system structure and measurement time of the system. With the development of display techniques, Li et al improved multi-screen based PMD by using a transparent screen [36]. The camera ray can pass through the transparent screen to a general displaying screen.…”

Section: Multi-screen Based Pmdmentioning

confidence: 99%

“…Phase shifting and phase unwrapping techniques are applied to obtain phase information [43,44]. Two groups of perpendicular fringe patterns are required to establish a phase rectangular coordinate system [29][30][31][32][33][34][35][36]45]. In order to suppress phase noise, each fringe pattern is captured several times to calculate the average [41,42,[47][48][49].…”

Section: Challenges and Further Developmentmentioning

confidence: 99%

A brief review of the technological advancements of phase measuring deflectometry

Gao

Jiang

2020

PhotoniX

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This paper presents a short review for phase measuring deflectometry (PMD). PMD is a phase calculation based technique for three-dimensional (3D) measurement of specular surfaces. PMD can achieve nano-scale form measurement accuracy with the advantages of high dynamic range, non-contact, full field measurement which makes it a competitive method for specular surface measurement. With the development of computer science, display and imaging technology, there has been an advancement in speed for PMD in recent years. This paper discusses PMD focusing on the difference on its system configuration. Measurement principles, progress, advantages and problems are discussed for each category. The challenges and future development of PMD are also discussed.

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Segmentation phase measuring deflectometry for measuring structured specular surfaces

Wang

Gao

et al. 2021

Int J Adv Manuf Technol

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Accurate and fast three-dimensional (3D) measurement for industrial products/components designed to possess 3D structured shapes is a key driver for improved productivity. However, challenges for current techniques are considerable to measure structured specular surfaces. A technique named segmentation phase measuring deflectometry (SPMD) is proposed in this paper, which enables structured specular surfaces to be measured with high accuracy in one setup. Concept of segmentation in topology is introduced into phase measuring deflectometry, which separates a surface with complex structures into continuous segments. Each segment can be reconstructed based on gradient information to achieve good form accuracy, and all reconstructed segments can be fused into a whole 3D strucutred form result based on their absolute spatial positioning data. Here, we propose and discuss the principle of SPMD, a segmentation technique to separate a strucured surface into segments, a spatial positioning technique to obtain absolute position of the segments, and a data fusion strategy to fuse all reconstructed segments. Experimental results show SPMD can achieve nanometer level accuracy for form measurement of continuous segments by comparing with stylus profilometer, which is significantly higher than the accuracy of direct phase measuring deflectometry. Meanwhile, SPMD has micron level spatial positioning accuracy for structures by measuring two specular steps and comparing with coordinate measuring machine, which differentiates this technique from gradient-based phase measuring deflectometry that extends measurement capability from continuous specular surfaces to complex structured specular surfaces. Compared with the existing measurement techniques, SPMD significantly improved the convenience and ability to measure freeform and structured specular surfaces with the advantages of high measurement accuracy, fast measurement, and potential application for embedded measurement.

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Phase measurement deflectometry with refraction model and its calibration

Cited by 34 publications

References 21 publications

Phase measuring deflectometry for obtaining 3D shape of specular surface: a review of the state-of-the-art

Phase measuring deflectometry for obtaining 3D shape of specular surface: a review of the state-of-the-art

A brief review of the technological advancements of phase measuring deflectometry

Segmentation phase measuring deflectometry for measuring structured specular surfaces

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