A new high-resolution transmission electron microscopy (HREM) technique is proposed for observing interfacial structures in semiconductor superlattices in the <1 1 0> cross-section, and is used to characterize AIAs-GaAs interfacial step structures. Analysis of diffracted beam amplitudes shows that the {1 1 1} beam amplitudes of GaAs are minimized at an extinction distance of 14.4 nm, whereas those of AlAs show significantly higher values. This remarkable difference in the {1 1 1} beam amplitudes leads to a marked contrast between HREM images of GaAs and AlAs around this specimen thickness, allowing edge-on observation of the interfacial atomic steps running along the <1 1 0> direction. Artifacts produced by ion milling prevent atomic-scale observations of the interfaces so an artifact-free TEM specimen preparation technique is also presented. The HREM method provides information on the step intervals and straightness of step edges at AIAs-GaAs interfaces fabricated on just-cut and vicinal GaAs (0 0 1) substrates. The effect of the growth interruption method during molecular beam epitaxy on interface smoothing is also demonstrated.