Phase deviation analysis and phase retrieval for partial intensity saturation in phase-shifting projected fringe profilometry

Chen, Yanming; He, Yuming; Hu, Eryi

doi:10.1016/j.optcom.2008.01.070

Cited by 34 publications

(15 citation statements)

References 14 publications

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“…Alternatively, Jiang et al [25] proposed a real-time HDR 3-D scanning method by projecting additional inverted fringe patterns. Chen et al [26] found that the phase-shifting methods can overcome the image saturation if the number of the phase shift is high enough so that at least three unsaturated fringe intensities can be recorded successfully. Moreover, Chen et al [27] proposed a technique, by which the phase is also calculated from raw phase-shifting images but without considering whether they are saturated or not.…”

Section: Introductionmentioning

confidence: 99%

Microscopic 3D measurement of shiny surfaces based on a multi-frequency phase-shifting scheme

Chen

Liang

et al. 2019

Optics and Lasers in Engineering

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Microscopic fringe projection profilometry is a powerful 3D measurement technique with a theoretical measurement accuracy better than one micron provided that the measured targets can be imaged with good fringe visibility. However, practically, the 3D shape of the measured surface can hardly be fully reconstructed due to the defocus of the dense fringes and complex surface reflexivity characteristics, which lead to low fringe quality and intensity saturation. To address this problem, we propose to calculate phases of these highlighted areas from a subset of the fringe sequence which is not subjected to the intensity saturation. By using the proposed multi-frequency phase-shifting scheme, the integrity of the 3D surface reconstruction can be significantly improved. The ultimate phase maps obtained from unsaturated intensities are used to achieve high-accuracy 3D recovering of shiny surfaces based on a phase stereo matching method. Experimental results on different metal surfaces show that our approach is able to retrieve the complete morphology of shiny surfaces with high accuracy and fidelity.

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Section: Introductionmentioning

confidence: 99%

Microscopic 3D measurement of shiny surfaces based on a multi-frequency phase-shifting scheme

Chen

Liang

et al. 2019

Optics and Lasers in Engineering

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“…Although a small camera aperture or exposure time can be used to capture fringe patterns, it simultaneously reduces the intensity modulation at surface regions with low reflectivity, resulting in poor phase accuracy. In order to address this problem, many methods have been proposed, such as using multiple camera viewpoints, 13 changing hardware configuration methods, [16][17][18][19] new phase-measurement algorithms, 20,21 high dynamic range (HDR) techniques, 12,22,23 and methods adjusting the pixel-wise intensity of fringe patterns. 2,3,14,24 Among them, HDR techniques and methods adjusting the pixel-wise intensity of fringe patterns have become the two most important methods.…”

Section: Introductionmentioning

confidence: 99%

Analysis and reduction of phase errors caused by nonuniform surface reflectivity in a phase-shifting measurement system

et al. 2017

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, "Analysis and reduction of phase errors caused by nonuniform surface reflectivity in a phase-shifting measurement system," Opt. Abstract. The measurement accuracy of a phase-shifting measurement system is adversely affected by phase errors. This paper presents a theoretical analysis of phase errors caused by nonuniform surface reflectivity, such as varying reflectivity and a sharp change in reflectivity. Based on the analysis, a method to adaptively adjust the maximum input gray level of each pixel in projected fringe patterns to the local reflectivity was proposed to reduce phase errors. Experimental results for a planar checkerboard show that the measurement error can be reduced by 56.6% by using the proposed method.

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“…The advantage of the FTP is that only one frame of image is necessary instead of 3-5 phase-shifting images used in the PMP [5][6][7][8]. Therefore, the FTP is suitable for the profile measurement of a moving object [9][10][11][12]. It has been reported that the line-scan CCD was used to measure the surface profile of a moving object [13][14][15][16][17].…”

Section: Introductionmentioning

confidence: 99%

Speed mismatch error in the profile measurement of moving object by using TDI imaging system

2010

SPIE Proceedings

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In the projected grating phase profilometry, the CCD camera operating in time delay and integration (TDI) mode is used to record the deformed fringe patterns. In this paper, the measuring system is consisted of a TDI CCD camera, a projector, optical lens and a personal computer. The detected object is put on a reference plane, and a sinusoidal grating is projected upon the object surface and reference plane at an incidence angle, respectively. The deformed fringe pattern of the detected object is captured by the TDI CCD camera, and the deformed fringe pattern is recorded in the personal computer for processing. A fast Fourier transform combining with a filtering method is used to extract the phase information caused by the profile of the detected object. The phase error caused by the image distortion is researched by simulative analysis when the moving speed mismatch between the TDI camera and the detected object is occurred.

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Phase deviation analysis and phase retrieval for partial intensity saturation in phase-shifting projected fringe profilometry

Cited by 34 publications

References 14 publications

Microscopic 3D measurement of shiny surfaces based on a multi-frequency phase-shifting scheme

Microscopic 3D measurement of shiny surfaces based on a multi-frequency phase-shifting scheme

Analysis and reduction of phase errors caused by nonuniform surface reflectivity in a phase-shifting measurement system

Speed mismatch error in the profile measurement of moving object by using TDI imaging system

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