1994
DOI: 10.1016/0030-4018(94)90072-8
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Phase contrast surface mode resonance microscopy

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Cited by 13 publications
(6 citation statements)
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“…As early as in 1976, Abeles [13] had figured out a theoretical description of dependence of phase difference on the wave vector along the surface of the Kretschmann configuration, and proposed the adoption of ellipsometry for investigating surface or interface reactions. In 1990s, Herminghaus [70] used phase-polarization properties of light to improve the contrast of SPR microscopy and employ it for the characterization of thin films. Kabashin [71,72] studied phase and polarization transformations under SPR and proposed to exploit SPR-related phase jump as a resonant point marker to considerably improve the contrast of the signal pattern in conventional SPR bio-and chemical sensing.…”
Section: Polarimetrymentioning
confidence: 99%
“…As early as in 1976, Abeles [13] had figured out a theoretical description of dependence of phase difference on the wave vector along the surface of the Kretschmann configuration, and proposed the adoption of ellipsometry for investigating surface or interface reactions. In 1990s, Herminghaus [70] used phase-polarization properties of light to improve the contrast of SPR microscopy and employ it for the characterization of thin films. Kabashin [71,72] studied phase and polarization transformations under SPR and proposed to exploit SPR-related phase jump as a resonant point marker to considerably improve the contrast of the signal pattern in conventional SPR bio-and chemical sensing.…”
Section: Polarimetrymentioning
confidence: 99%
“…15 Since infinitesimally small changes of system parameters can result in totally different phase behavior, one may anticipate here a large potential for an improvement of the performance of SPR-based imaging and sensor methods. Later we show that the SPR phase jump and the strong dependence of the SPR phase upon system parameters ͑for example, optical thickness͒ can be used to improve the sensitivity of the SPR microscopy technique [16][17][18] and develop interferometric SPR imaging ͑ISPRI͒ with monoatomic thickness and micrometer spatial resolutions. For this, we combine a SPR interferometer 14 with a conventional SPR microscope 16 by an introduction of an additional reference beam, which interferes with the SPR signal beam.…”
mentioning
confidence: 94%
“…Regions of the sample having the correct optical thickness to support an optical waveguide mode at a chosen angle of incidence will appear dark in reflection, while other areas will appear bright (Fig. 1, A and B) (12,13). We sought to apply this experimental system to single living cells.…”
mentioning
confidence: 99%