2010
DOI: 10.1002/cite.201000090
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Phase‐contrast Atomic Force Microscopy for the Characterization of the Distribution of Nanoparticles in Composite Materials

Abstract: Phase-contrast Atomic Force Microscopy for the Characterization of the Distribution of Nanoparticles in Composite MaterialsAtomic Force Microscopy (AFM) is a versatile tool for analyzing particle and disperse systems. The method of phase contrast imaging as an AFM modality is investigated for applicability for analyzing the state of dispersion. It is shown how homogeneity as well as state of agglomeration can be examined for nanoparticles in a polymer or wax matrix. A method to achieve quantitative information… Show more

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Cited by 8 publications
(5 citation statements)
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“…Polymer concentration c Poly depending on the nanoparticle concentration in the solids fraction F and the solids concentration in the DCM c solid as well as addition of fatty acid surfactant with a mass ratio to the nanoparticles of D = 0.2 g/g. dispersion quality in the composite material using back-scattering scanning electron microscopy and phase contrast atomic force microscopy [43].…”
Section: Discussionmentioning
confidence: 99%
“…Polymer concentration c Poly depending on the nanoparticle concentration in the solids fraction F and the solids concentration in the DCM c solid as well as addition of fatty acid surfactant with a mass ratio to the nanoparticles of D = 0.2 g/g. dispersion quality in the composite material using back-scattering scanning electron microscopy and phase contrast atomic force microscopy [43].…”
Section: Discussionmentioning
confidence: 99%
“…It contains mostly feldspar as a matrix (∼60 %) and crystals of nepheline (∼12 %), aegirine (∼15 %), eudialyte (∼7 %), and other silicate type minerals. The samples are prepared by being embedded in epoxy resin and planarized as described in [33], except that the final step of polishing is achieved using 1 lm particulate diamond slurry. This preparation results in a root mean squared roughness of the surfaces of less than 10 nm on a 10 × 10 lm cross section.…”
Section: Mineral Substratesmentioning
confidence: 99%
“…[19,20] To obtain the influence of the wetting behavior, both the colloidal probe as well as the substrate is surrounded by deionized water. The used substrates were fixated on the bottom of the liquid cell to avoid unmeant movement.…”
Section: Model System and Afm Studymentioning
confidence: 99%