Periodic Jitter Amplitude Calibration with Walking Strobe

Liu, L.; Lew, E.

doi:10.1109/test.2006.297714

Cited by 6 publications

(2 citation statements)

References 2 publications

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“…A) Modulating bias voltage of output buffer [1] B) Modulating reference clock [2] C) Using Arbitrary Waveform Generator (AWG) D) Using timing set [4] The former two methods [1,2] employ analogue domain signal modulation, using a signal generator to supply a jitter waveform and modulating the output signal by that Applying an AWG to emulate a jitter injected signal is a widely used method. By this method, a jitter injected signal is synthesized by superposing a jitter signal on the original waveform.…”

Section: Review Of Prior Workmentioning

confidence: 99%

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Dynamic arbitrary jitter injection method for ≫6.5Gb/s SerDes testing

Fujibe

Suda

Yamamoto

et al. 2009

2009 International Test Conference

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A dynamic arbitrary jitter injection method that can be integrated into our high speed and high density CMOS timing generator has been developed. This method makes it possible to inject arbitrary jitter including Periodic Jitter, Random Jitter and Data Dependent Jitter in order to realize flexible SerDes device testing. By this method, furthermore, jitter injection is dynamically and synchronously controllable according to a test pattern. We have implemented our jitter injection method in a prototype chip to demonstrate the concept. The chip includes a 6.5Gb/s timing generator and was fabricated by a 90nm CMOS process. Area and power consumption for each edge including the jitter injection scheme and timing generator are 0.2mm 2 and 43.8mW respectively.

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Section: Review Of Prior Workmentioning

confidence: 99%

“…There are several prior works which utilize analogue signal processing for jitter injection testing [1,2]. In these methods, jitter is injected according to a jitter signal produced by an installed signal generator that works independently from the test pattern.…”

Section: Introductionmentioning

confidence: 99%