2011 IEEE 13th Electronics Packaging Technology Conference 2011
DOI: 10.1109/eptc.2011.6184400
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Performances of Wafer-Level UnderFill with 50µm pitch interconnections: Comparison with conventional underfill

Abstract: This paper deals with the performances of Wafer-Level UnderFill in ultra-fine 50 microns pitch interconnections. Firstly, dry-film WLUF assembly feasibility has been demonstrated by checking lamination and planarity in the pillar areas. Well-formed Pb-free joints have been obtained after thermocompression with limited void or WLUF entrapment. Secondly, to have a better understanding of this innovative material performances during thermal and moisture tests, the electrical behavior of Copper pillars chains surr… Show more

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Cited by 6 publications
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“…For the assembly of wafer grades of 50 microns or less, the influence of capillary UF on the electrical functions of Cu pillars under thermomechanical stresses should be considered. The rounded-corner shape and coverage issues of Si-to-Si stacks can be also suppressed [ 22 ]. In this study, we aimed to investigate damage modes in Cu-Cu joints with different dielectrics under thermal cycling.…”
Section: Introductionmentioning
confidence: 99%
“…For the assembly of wafer grades of 50 microns or less, the influence of capillary UF on the electrical functions of Cu pillars under thermomechanical stresses should be considered. The rounded-corner shape and coverage issues of Si-to-Si stacks can be also suppressed [ 22 ]. In this study, we aimed to investigate damage modes in Cu-Cu joints with different dielectrics under thermal cycling.…”
Section: Introductionmentioning
confidence: 99%