2016
DOI: 10.1063/1.4959405
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Performances and failure of field-aged PV modules operating in Saharan region of Algeria

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Cited by 7 publications
(17 citation statements)
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“…In 27 , Sheeraz Kirmani et al analyzed long-term monitoring data to determine the degradation rates of crystalline modules after 15 years of field exposure in India, which was reported to be 0.5% per year. Two studies were conducted by Sadok, et al 28 , 29 ; one was for assessing the degradation of PV modules and detecting possible defects by a visual inspection method. The average annual power degradation rate of mono-crystalline PV modules is around 1.55% after 11 years of outdoor operation.…”
Section: Introductionmentioning
confidence: 99%
“…In 27 , Sheeraz Kirmani et al analyzed long-term monitoring data to determine the degradation rates of crystalline modules after 15 years of field exposure in India, which was reported to be 0.5% per year. Two studies were conducted by Sadok, et al 28 , 29 ; one was for assessing the degradation of PV modules and detecting possible defects by a visual inspection method. The average annual power degradation rate of mono-crystalline PV modules is around 1.55% after 11 years of outdoor operation.…”
Section: Introductionmentioning
confidence: 99%
“…A common crystalline silicon cell failure is interconnection breakage, often from thermal/mechanical stresses causing visible burn marks affecting fill factor (FF) and Rs [8][9][10][11][12][13][14][15][16]. Cracks frequently arise in c-Si and thin film (TF) cells due to thermal cycles, transportation, installation, or manual cleaning [8,14,22].…”
Section: Degradation Processes and Mechanismsmentioning
confidence: 99%
“…Associated defects like delamination and corrosion can be characterized through electroluminescence, photoluminescence, hyperspectral imaging, lock-in thermography, and RUV imaging [34][35][36], degrading Isc and FF [34][35][36]. Shunts in c-Si cells linked to recombination-inducing impurities are detectable via lock-in thermography and reduce Isc and FF [9][10][11]. Metallization and bus bar corrosion caused by moisture ingress produces observable burn marks and cell delamination, increasing Rs while cutting FF .…”
Section: Degradation Processes and Mechanismsmentioning
confidence: 99%
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