2009
DOI: 10.1117/12.826840
|View full text |Cite
|
Sign up to set email alerts
|

Performance prediction and measurement of silicon pore optics

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
2

Citation Types

0
7
0

Year Published

2009
2009
2024
2024

Publication Types

Select...
5
2
1

Relationship

4
4

Authors

Journals

citations
Cited by 11 publications
(7 citation statements)
references
References 0 publications
0
7
0
Order By: Relevance
“…For our application we have to stack shorter wafers with an inner bending radius of 0.3 m. The smaller bending radius has been studied by finite element modeling and has been demonstrated by bending and bonding of two mirror plates with this radius (Cosine Research (NL) private communication). An angular resolution (HEW) < 20" has been repeatedly demonstrated by X-ray pencil beam measurements performed at PTB in Berlin for a set up to 45 plates of an IXO mirror module, mounted in representative flight configuration [10] [13]. These results indicate that in the case of ORIGIN, the 30″ HEW requirement on-axis, being dominated by the conical approximation to the Wolter-I optics, is achievable.…”
Section: Outer Section -Silicon Pore Opticsmentioning
confidence: 63%
“…For our application we have to stack shorter wafers with an inner bending radius of 0.3 m. The smaller bending radius has been studied by finite element modeling and has been demonstrated by bending and bonding of two mirror plates with this radius (Cosine Research (NL) private communication). An angular resolution (HEW) < 20" has been repeatedly demonstrated by X-ray pencil beam measurements performed at PTB in Berlin for a set up to 45 plates of an IXO mirror module, mounted in representative flight configuration [10] [13]. These results indicate that in the case of ORIGIN, the 30″ HEW requirement on-axis, being dominated by the conical approximation to the Wolter-I optics, is achievable.…”
Section: Outer Section -Silicon Pore Opticsmentioning
confidence: 63%
“…Because of the stiffening effect of the ribs in longitudinal direction the mirror surface spanned between two ribs does not have local deformations on sub mm length scales. It has been experimentally verified [20] that scanning a thin stripe of 0.05 mm width and the full length of a pore (corresponding to ~6 mm 2 per pore) is equivalent to measure the entire width (0.83 mm) and length of that pore (corresponding to ~55 mm 2 ), which has also been demonstrated by comparison of pencil beam an full beam illumination at PANTER [16]. This does also indicate that the broadening of the PSF with increasing stack height is caused by residual particulate contamination acting on tens of millimetre length scales and not by intrinsic mid spatial frequency errors in the plates.…”
Section: Figure 5 First Pull Tests Performed On Bonded Plates (Left)mentioning
confidence: 83%
“…Additional measurements [20] demonstrate that scanning the plate in full length but sampling only a thin stripe within a pore is a valid approach to determine the PSF of the entire pore. Because of the stiffening effect of the ribs in longitudinal direction the mirror surface spanned between two ribs does not have local deformations on sub mm length scales.…”
Section: Figure 5 First Pull Tests Performed On Bonded Plates (Left)mentioning
confidence: 99%
“…All of these steps are part of a technology development program of the European Space Agency ESA, carried out in close co-operation with the authors of this paper. The development program has been running for several years and covers all areas relevant for achieving a technology readiness level of 5, as required for to qualify the technology for an ESA L-class mission [21][22][23][24][25][26][27][28][29][30][31][32][33][34][35]:…”
Section: Silicon Pore Opticsmentioning
confidence: 99%