2020
DOI: 10.1016/j.optmat.2020.109897
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Performance optimization of CH3NH3Pb(I1-xBrx)3 based perovskite solar cells by comparing different ETL materials through conduction band offset engineering

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Cited by 94 publications
(53 citation statements)
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“…As a result, a large built‐in electric potential is developed between the HTL and the absorber interface at the high acceptor density. [ 43,52,76 ]…”
Section: Resultsmentioning
confidence: 99%
“…As a result, a large built‐in electric potential is developed between the HTL and the absorber interface at the high acceptor density. [ 43,52,76 ]…”
Section: Resultsmentioning
confidence: 99%
“…The PCE is sufficient at low temperature, which is determined to be 31.74% at a temperature of 273 K, while it reduces to 20.70% at 473 K. The degradation nature in efficiency at high temperatures observed herein is in good agreement with the temperature‐dependent PV outputs discussed in previous reports. [ 32,33,50,71 ]…”
Section: Resultsmentioning
confidence: 99%
“…[ 22 ] Moreover, it has been stated that incorporation of highly doped HTLs at the back side of heterojunction TFSCs improves the carrier collection probability through proper band alignment by decreasing rear surface recombination. [ 31–34 ] This creates an built‐in potential at absorber(p)/HTL(p + ) junction, which causes ease of transportation of holes to the back contact through the HTL, as well as minority carrier reflection from rear surface to front electrode. The conduction band offset (CBO) and valance band offset (VBO) at both at buffer/absorber and absorber/HTL interfaces, respectively, play a crucial role in studying interface recombination for determining high‐performance solar cells.…”
Section: Introductionmentioning
confidence: 99%
“…[ 48,49 ] This program requires significant number of semiconductor parameters and optical parameters [ 46 ] such as conduction band effective density of states ( N c ), valence band effective density of states ( N v ), bandgap ( E g ), electron affinity ( χ ), dielectric permittivity ( ϵ r ), electron mobility ( μ e ), hole mobility ( μ h ), donor density ( P d ), acceptor density ( P a ), radiative recombination coefficient ( R a ), defect density ( N t ), and absorption coefficient ( α ). [ 49–51 ]…”
Section: Device Structure and Simulation Parametermentioning
confidence: 99%