Sputtering Materials for VLSI and Thin Film Devices 2014
DOI: 10.1016/b978-0-8155-1593-7.00003-5
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Performance of Sputtering Targets and Productivity

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“…We also observe that specimens with finer grains have higher microhardness. As stated by Dunlop et al [51] and Sarkar et al [52], the performance of the sputtering target during the PVD process is in correlation with the averaged grain size of the sputtering target. Their works showed that the surface uniformity of the deposited thin film has an inverse correlation with the average grain size of the sputtering target.…”
Section: Comparison Of Specimens Produced By L-pbf With Vht and Hp Wi...mentioning
confidence: 90%
“…We also observe that specimens with finer grains have higher microhardness. As stated by Dunlop et al [51] and Sarkar et al [52], the performance of the sputtering target during the PVD process is in correlation with the averaged grain size of the sputtering target. Their works showed that the surface uniformity of the deposited thin film has an inverse correlation with the average grain size of the sputtering target.…”
Section: Comparison Of Specimens Produced By L-pbf With Vht and Hp Wi...mentioning
confidence: 90%