2000
DOI: 10.1116/1.1319832
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Performance of a compact beamline with high brightness for x-ray lithography

Abstract: We have developed a short beamline with high brightness for x-ray lithography. The beamline contains a single, a scanning toroidal mirror and a vacuum-protection system with an acoustic delay line. The practical exposure intensity on a wafer was approximately 50 mW/cm 2 at stored electron current of 500 mA. Dose uniformity of Ϯ2.8% was achieved in a 26 mmϫ26 mm exposure area by optimizing the scan speed. Minimum resolution of 80 nm was obtained with a 15 m gap. The optimum dose for TDUR-N908 ͑Tokyo Ohka͒ was 1… Show more

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Cited by 6 publications
(5 citation statements)
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“…7 In Fig. SHI's Aurora-2 3,4 and its beamline 5,6 have demonstrated the performance as the hardest spectrum presently used.…”
Section: A Improvement Of Beam Qualitymentioning
confidence: 98%
“…7 In Fig. SHI's Aurora-2 3,4 and its beamline 5,6 have demonstrated the performance as the hardest spectrum presently used.…”
Section: A Improvement Of Beam Qualitymentioning
confidence: 98%
“…Several compact beamlines (e.g., BL11 and BL13) less than 5 m long for micro-fabrication already developed were adopted to carry out the X-ray deep lithography. Detailed descriptions for BL11 have been written elsewhere (Hirose 2000). The BL13 consists of (a) a front end connected to the SR source, an ultrahigh vacuum part (base pressure of 2 9 10 -9 Torr), (b) an intermediate part with some filters (50 lm of beryllium, 100 9 10 mm 2 ), also an ultrahigh vacuum part, and (c) an exposure chamber separated by a beryllium window (300 lm, 100 9 10 mm 2 ).…”
Section: Fabrication Of Liga Mold Insertsmentioning
confidence: 99%
“…Recently, we achieved an exposure dose intensity of 43 mW/cm 2 on a wafer at 500 mW beam current, the dose uniformity of Ϯ2.8% within a 26ϫ26 mm 2 exposure area using our original short beamline. 4,5 The critical wavelength of 1.4 nm characterizes A2S as a soft x-ray source. The majority of the SR beam at the end of the beamline lies around 1.5 keV ͑0.8 nm͒.…”
Section: A Compact Sr Light Sourcementioning
confidence: 99%