2017
DOI: 10.1016/j.spmi.2017.06.039
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Performance comparison of ideal and defected bilayer graphene nanoribbon FETs

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Cited by 7 publications
(1 citation statement)
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“…There are usually some unwanted defects arising during the fabrication process such as vacancies, edge-roughness and Stone-Wales (SW) defects. [24][25][26][27] The SW defect is one of the most observable defects in graphene systems. 28 An in-plane bond rotation causes a SW defect revealing two pentagons and two heptagons.…”
mentioning
confidence: 99%
“…There are usually some unwanted defects arising during the fabrication process such as vacancies, edge-roughness and Stone-Wales (SW) defects. [24][25][26][27] The SW defect is one of the most observable defects in graphene systems. 28 An in-plane bond rotation causes a SW defect revealing two pentagons and two heptagons.…”
mentioning
confidence: 99%