PDF testability of the circuits derived by special covering ROBDDs with gates

Simplification of fully delay testable combinational circuits and finding of PDF test pairs

“…It is necessary to justify its application for the circuits that originate MSoPs instead of ReedMuller expressions in [7]. In [9] …”

“…Finding test pairs for robust testable and validatable non robust testable faults is based on the approach suggested in [7]. It is necessary to justify its application for the circuits that originate MSoPs instead of ReedMuller expressions in [7].…”

“…When applying test pairs in the definite order, we may detect any PDF of the circuit. This means that the circuits suggested in this paper (as the circuits in [7]) guarantee 100% testability for PDFs without an additional input. The experimental results showed that the suggested circuits as a rule were simpler than the ones in [Ibid.…”

“…When using this approach, it is possible to cut path lengths of the combinational circuits and cut the number of OR, AND, NOT gates if we implement XOR as a sub-circuit from these gates. It is revealed that PDFs in the resulted circuits (similar circuits are considered in [7]) manifest themselves either as robust testable or as validatable non robust testable ones. When applying test pairs in the definite order, we may detect any PDF of the circuit.…”

“…In [7] the combinational circuits constructed from ROBDDs by Invert-AND-XOR implementation of the corresponding to an internal node v are considered. In this formula, the operation " "…”