PASSAT 2.0: A multi-functional SAT-based testing framework

Drechsler, Rolf; Diepenbeck, Melanie; Eggersglus, Stephan; Wille, Robert

doi:10.1109/latw.2013.6562675

Cited by 5 publications

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“…In this paper, we propose a new basic test formulation following the ideas presented in [28]. Hereby, the test compaction abilities of SAT-based ATPG are enhanced during the actual test generation.…”

Section: Introductionmentioning

confidence: 99%

Improved SAT-based ATPG: More constraints, better compaction

Eggersglüß

Wille

Drechsler

2013

2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)

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Abstract-Automatic Test Pattern Generation (ATPG) based on Boolean Satisfiability (SAT) is a robust alternative to classical structural ATPG. Due to the powerful reasoning engines of modern SAT solvers, SAT-based algorithms typically provide a high test coverage because of the ability to reliably classify hard-to-detect faults. However, a drawback of SAT-based ATPG is the test compaction ability. In this paper, we propose an enhanced dynamic test compaction approach which leverages the high implicative power of modern SAT solvers. Fault detection constraints are encoded into the SAT instance and a formal optimization procedure is applied to increase the detection ability of the generated tests. Experiments show that the proposed approach is able to achieve high compaction -for certain benchmarks even smaller test sets than the currently best known results are obtained.

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Section: Introductionmentioning

confidence: 99%