2019
DOI: 10.1007/s10948-019-5020-9
|View full text |Cite
|
Sign up to set email alerts
|

Particulate Generation on Surface of Iron Selenide Films by Air Exposure

Abstract: Nanometer-sized particular structures are generated on the surfaces of FeSe epitaxial films directly after exposure to air; this phenomenon was studied in the current work because these structures are an obstacle to field-induced superconductivity in electric double-layer transistors using FeSe channel layers. Chemical analyses using field-effect scanning Auger electron spectroscopy revealed no clear difference in the chemical composition between the particular structures and the other flat surface region.This… Show more

Help me understand this report
View preprint versions

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
3
0

Year Published

2019
2019
2019
2019

Publication Types

Select...
2
1

Relationship

2
1

Authors

Journals

citations
Cited by 3 publications
(3 citation statements)
references
References 43 publications
0
3
0
Order By: Relevance
“…Electronic structures were observed directly by angle-resolved photoemission spectroscopy (ARPES) excited by monochromatic He Iα light with a photon energy of 21.2180 eV from an MBS L-1 discharge lamp (MB Scientific AB, Sweden). Before the ARPES measurements, we constructed an allin situ sample transfer system [36] (i.e., to prevent sample exposure to any gasses such as air, pure N 2 , or Ar), in which the growth chamber, ARPES measurement chamber, and sample carrier transfer chambers were connected in an ultrahigh vacuum of <1×10 −7 Pa because of the serious sensitivity of FeSe surfaces to air [37]. The ARPES measurements were carried out under an ultrahigh vacuum of <4×10 −8 Pa and at a low temperature of ~10 K. We scanned along the Γ−M line using a Scienta DA30 photoelectron analyzer (Scienta Omicron Inc., Germany).…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…Electronic structures were observed directly by angle-resolved photoemission spectroscopy (ARPES) excited by monochromatic He Iα light with a photon energy of 21.2180 eV from an MBS L-1 discharge lamp (MB Scientific AB, Sweden). Before the ARPES measurements, we constructed an allin situ sample transfer system [36] (i.e., to prevent sample exposure to any gasses such as air, pure N 2 , or Ar), in which the growth chamber, ARPES measurement chamber, and sample carrier transfer chambers were connected in an ultrahigh vacuum of <1×10 −7 Pa because of the serious sensitivity of FeSe surfaces to air [37]. The ARPES measurements were carried out under an ultrahigh vacuum of <4×10 −8 Pa and at a low temperature of ~10 K. We scanned along the Γ−M line using a Scienta DA30 photoelectron analyzer (Scienta Omicron Inc., Germany).…”
Section: Methodsmentioning
confidence: 99%
“…Small particles with lateral sizes of ~40 nm and heights of ~10 nm in Fig. 2(c) originated from surface degradation of the samples induced by air exposure during AFM observation[37]. For all the films, we evaluated the crystallinity along the c axis from Δω of the FeSe 001 diffraction and surface roughness from R rms .Figure 2(e) plots these values as a function of T s .…”
mentioning
confidence: 99%
“…Therefore, carriers are doped in the channel but the channel thickness and/or surface state changed during the measurements. Possible reasons for the changes in the channel during cycling may be electrochemical etching by the ionic liquid [15] and surface degradation, similar to the case for t-FeSe [14,37]. Thus, further improvement of film quality and the fabrication process of the EDLT is necessary to induce superconductivity in t-FeS EDLT structures.…”
Section: Resultsmentioning
confidence: 97%