Partial scan flip-flop selection by use of empirical testability

Kim, Kee S.; Kime, C.R.

doi:10.1007/bf00993313

Cited by 11 publications

(3 citation statements)

References 15 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…1) Structure-based [10,15,20]: choose scan circuitry using structure-based scan selection techniques. These techniques include loop breaking, self-loop breaking and limiting the design's sequential depth;…”

Section: Related Workmentioning

confidence: 99%

“…Selection of scan flip-flops in hardware has been the subject of several research works in past years [5,6,15,16,18], since reducing the number of scan chain flip-flops means reducing the area overhead and the test time. Additionally, a careful selection of flip-flops can significantly increase the effectiveness of the ATPG (Automatic Test Pattern Generation) tool.…”

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Using a software testing technique to identify registers for partial scan implementation

Krug

Moraes²,

Lubaszewski

2006

Proceedings of the 19th Annual Symposium on Integrated Circuits and Systems Design

View full text Add to dashboard Cite

Scan design has been widely used to ease test generation process for digital circuits. Although full scan approach results in high fault coverage while reducing ATPG effort, it introduces area and performance overheads that are most times unacceptable. Hence, partial scan is a commonly used technique to improve testability of sequential circuits while respecting design constraints. In this paper, we present a method to select sequential elements (flipflops) to compose a partial scan chain. We use a software engineering technique to identify internal variables or signals of the circuit's behavioral description that have low observability. Experiments demonstrate that our approach achieves a high fault coverage including few flip-flops in the scan chain. Moreover, comparative results show that, for complex circuits, proposed technique is more efficient than some classical methods in selecting flip-flops to compose partial scan.

show abstract

Section: Related Workmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Using a software testing technique to identify registers for partial scan implementation

Krug

Moraes²,

Lubaszewski

2006

Proceedings of the 19th Annual Symposium on Integrated Circuits and Systems Design

View full text Add to dashboard Cite

show abstract

“…Find all the unobservable ip-ops.3 If no unobservable ip-op exists, return R 4. For each unobservable ip-op, count the number of unobservable ip-ops that can reach it through paths in the circuit.5 Select the ip-op ffi that is reachable from the largest number of unobservable ip-ops.…”

mentioning

confidence: 99%

Full scan fault coverage with partial scan

Lin

Pomeranz

Reddy

1999

Proceedings of the Conference on Design, Automation and Test in Europe

View full text Add to dashboard Cite

In this paper, a test generation based p artial scan selection procedure i s p r oposed. The procedure is able to achieve the same level of fault coverage as in a full scan design by scanning only a subset of the ip-ops. New measures are used to guide the ip-op selection during the procedure. The proposed p r ocedure is applied to the ISCAS-89 and the ADDENDUM-93 benchmark circuits. For all the circuits, it is possible to achieve the same fault coverage as that for full scan while scanning a portion of the ip-ops.

show abstract

A New Design-for-Testability Method Based on Thru-Testability

Ooi

Fujiwara

2011

J Electron Test

View full text Add to dashboard Cite

Partial scan flip-flop selection by use of empirical testability

Cited by 11 publications

References 15 publications

Using a software testing technique to identify registers for partial scan implementation

Using a software testing technique to identify registers for partial scan implementation

Full scan fault coverage with partial scan

A New Design-for-Testability Method Based on Thru-Testability

Contact Info

Product

Resources

About