Parallel nanoimaging using an array of 30 heated microcantilevers

Seong, Myunghoon; Somnath, Suhas; Kim, Hoe Joon; King, William P.

doi:10.1039/c4ra02853h

Cited by 8 publications

(10 citation statements)

References 39 publications

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“…Recently, a group led by King developed arrays of 5 and 30 heated tips that were integrated into multiple commercially available AFMs with minimal custom hardware. Using these arrays they demonstrated parallel TCNL [ 199 ], parallel and independent thermomechanical lithography as shown in Figure 15 [ 178 ], and high speed, large-area topography imaging [ 178 , 200 ]. In addition, arrays with ultra-nanocrystalline diamond tips or with lower-stiffness cantilevers have been developed to reduce tip wear during the use of cantilever tips under extreme operating conditions, such as high loading force, high scan speed, and hard scanning substrate [ 201 , 202 ].…”

Section: Advancement Of Scalable Tbn Approachesmentioning

confidence: 99%

Tip-Based Nanofabrication for Scalable Manufacturing

Hu¹,

Kim

Somnath

2017

Micromachines

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Tip-based nanofabrication (TBN) is a family of emerging nanofabrication techniques that use a nanometer scale tip to fabricate nanostructures. In this review, we first introduce the history of the TBN and the technology development. We then briefly review various TBN techniques that use different physical or chemical mechanisms to fabricate features and discuss some of the state-of-the-art techniques. Subsequently, we focus on those TBN methods that have demonstrated potential to scale up the manufacturing throughput. Finally, we discuss several research directions that are essential for making TBN a scalable nano-manufacturing technology.

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Section: Advancement Of Scalable Tbn Approachesmentioning

confidence: 99%

Tip-Based Nanofabrication for Scalable Manufacturing

Hu¹,

Kim

Somnath

2017

Micromachines

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“…However, this is by no means the limit of the tool, the high sample throughput and resolution, coupled with the physical nature of the imaging tip, means that the HS-AFM can also be used to mark, pattern and print on material surfaces. AFMs and HS-AFMs are capable of writing these structures to surfaces, 52,143,145,167,[229][230][231][232][233][234][235][236][237][238][239][240][241][242][243][244] in a technique called nanolithography. As with many of the imaging modes, the methods described here have been transferred from standard AFMs.…”

Section: Fabrication Of Nanostructuresmentioning

confidence: 99%

“…Since optical detection systems do not easily scale it is common to find that each probe is self-sensing. 61,[145][146][147] More recently Seong et al and Somnath et al have both made use of a parallel HS-AFM to create composite images hundreds of microns in size145,148 (as shown in Fig. 9).…”

Section: Imaging Large Structuresmentioning

confidence: 99%

High-speed atomic force microscopy for materials science

Payton

Picco

Scott

2016

International Materials Reviews

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Since its inception in 1986, the field of atomic force microscopy (AFM) has enabled surface analysis and characterisation with unparalleled resolution in a wide variety of environments. However, the technique is limited by very low sample throughput and temporal resolution making it impractical for materials science research on macro sized or time evolving samples such as the observation of corrosion. The potential of AFM sparked intense efforts to overcome these limitations shortly after its invention, and has led to the development of high-speed atomic force microscopes (HS-AFMs). Within the last 5 years the technology underpinning these instruments has matured to the point where routine imaging can achieve megapixels per second over scan areas of square millimetres, removing the limitations from AFM for industrial scale materials characterisation. This review explains the technology and looks to the future use of HS-AFMs in materials science.

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“…), and by replacing expensive components with off-the-shelf electronics and streamlining functionality for uniform samples, a special-purpose HSAFM system has the potential to reach the cost of a high-end CE instrument. For instance, multiprobe configurationswhich are achievable − but rare in commercial AFMsmay be worth the added complexity for specialized scanning of uniform, large-area samples due to the improvements in sampling rate that could permit dPCR–HSAFM quantitation down to 1 part in 1000. Besides the system expense, the cost of a single diagnostic test must also be considered, and this cost for HSAFM is low.…”

Section: Resultsmentioning

confidence: 99%

Digital Polymerase Chain Reaction Paired with High-Speed Atomic Force Microscopy for Quantitation and Length Analysis of DNA Length Polymorphisms

et al. 2020

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DNA length polymorphisms are found in many serious diseases, and assessment of their length and abundance is often critical for accurate diagnosis. However, measuring their length and frequency in a mostly wild-type background, as occurs in many situations, remains challenging due to their variable and repetitive nature. To overcome these hurdles, we combined two powerful techniques, digital polymerase chain reaction (dPCR) and high-speed atomic force microscopy (HSAFM), to create a simple, rapid, and flexible method for quantifying both the size and proportion of DNA length polymorphisms. In our approach, individual amplicons from each dPCR partition are imaged and sized directly. We focused on internal tandem duplications (ITDs) located within the FLT3 gene, which are associated with acute myeloid leukemia and often indicative of a poor prognosis. In an analysis of over 1.5 million HSAFM-imaged amplicons from cell line and clinical samples containing FLT3-ITDs, dPCR–HSAFM returned the expected variant length and variant allele frequency, down to 5% variant samples. As a high-throughput method with single-molecule resolution, dPCR–HSAFM thus represents an advance in HSAFM analysis and a powerful tool for the diagnosis of length polymorphisms.

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Parallel nanoimaging using an array of 30 heated microcantilevers

Abstract: Parallel nanoimaging using an array of 30 heated AFM cantilevers is reported. The measurement speed and area are increased over standard AFM by two orders of magnitude.

Cited by 8 publications

References 39 publications

Tip-Based Nanofabrication for Scalable Manufacturing

Tip-Based Nanofabrication for Scalable Manufacturing

High-speed atomic force microscopy for materials science

Digital Polymerase Chain Reaction Paired with High-Speed Atomic Force Microscopy for Quantitation and Length Analysis of DNA Length Polymorphisms

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