2015
DOI: 10.1016/j.nimb.2014.12.072
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Paintings on copper by the Flemish artist Frans Francken II: PIXE characterization by external microbeam

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Cited by 15 publications
(8 citation statements)
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“…For large irradiation areas the area can be defined by defocusing the punctual beam using the focusing lens. More details on the used microprobe end‐station including the in‐vacuum and the external beam setup can be found elsewhere …”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…For large irradiation areas the area can be defined by defocusing the punctual beam using the focusing lens. More details on the used microprobe end‐station including the in‐vacuum and the external beam setup can be found elsewhere …”
Section: Methodsmentioning
confidence: 99%
“…More details on the used microprobe end-station including the in-vacuum and the external beam setup can be found elsewhere. [15,16,18] The referred experimental chamber upgrade was performed in order to allow in situ electrical characterization as well as ionoluminescence (IL) measurements simultaneously with conventional IBA techniques as PIXE and RBS. Figure 1 shows a schematic of the chamber with the distribution of the different detectors associated with the different characterization techniques.…”
Section: The μ-Probe Set-up For In Situ Analysismentioning
confidence: 99%
“…Smalt is a glassy pigment that develops color with cobalt element. It has been industrialized in Europe since the 15th century and it has been widely used in European oil paintings and church murals [22][23][24][25][26][27]. In the 19th century, it was gradually replaced by other inexpensive arti cial blue pigments.…”
Section: Discussionmentioning
confidence: 99%
“…Working with an external beam set-up, especially for cultural heritage studies, as in many ion beam laboratories [6][7][8][9][10][11][12][13][14][15][16][17], has the advantage of allowing fast and efficient measurements with direct analysis and easy positioning of object having any size and shape, without need of sampling, and no charging effects and heating from beam irradiation, thus strongly reducing the risk of damaging the object (truly "not deliberately destructive" measurements).…”
Section: External Beammentioning
confidence: 99%