2014
DOI: 10.1109/tpel.2013.2264941
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Package Parasitic Inductance Extraction and Simulation Model Development for the High-Voltage Cascode GaN HEMT

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Cited by 245 publications
(99 citation statements)
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“…In addition, the extraction of the interconnection parasitic inductances of the PCB traces is implemented by an Ansoft Q3D Extractor finite-element analysis (FEA) simulation [34], [35]. Table I shows the parasitic inductances in the proposed analytical model.…”
Section: A Extraction Of Key Parametersmentioning
confidence: 99%
See 1 more Smart Citation
“…In addition, the extraction of the interconnection parasitic inductances of the PCB traces is implemented by an Ansoft Q3D Extractor finite-element analysis (FEA) simulation [34], [35]. Table I shows the parasitic inductances in the proposed analytical model.…”
Section: A Extraction Of Key Parametersmentioning
confidence: 99%
“…This is because the junction capacitances and trans-conductance of all the devices are difficult to maintain a high consistency with the data in the datasheet. In addition, the parasitic inductances include the self-inductances and the mutual-inductances, which are influenced by several factors, including the conductor position, current direction, and oscillation frequency [34], [35]. However, the current directions and oscillation frequency are …”
Section: B Verificationmentioning
confidence: 99%
“…Through this comparison, it can be observed that surface mount package is effective to reduce the value of parasitic inductance while Kelvin connection (K) is able to decouple power loop with driving loop so that the source inductance is no longer the common source inductance. Unlikely to e-mode GaN devices, the cascode GaN device has much complex parasitic inductance distribution and the identification of the CSI is not straight-forward [23], [24]. In the first step, the CSI of the low-voltage Si MOSFET and of the high-voltage GaN HEMT are analyzed separately.…”
Section: B Packaging Influencementioning
confidence: 99%
“…Such models include a power loss estimation model; (4) a simple GaN power transistor model with temperature-and frequency-dependent inductor circuits, (5) which exhibited strong static characteristics; and a model considering detailed parasitic inductance and cascode capacitance. (6,7) Other models include one with turn-off resistance that was developed for sorting device uniformity. (8) The goal of all the aforementioned studies was to develop GaN FET models that are more practical than real power devices.…”
Section: Introductionmentioning
confidence: 99%