2007
DOI: 10.1016/j.tsf.2007.07.157
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Oxygen-adsorption characterization of activated non-evaporable Ti–Zr–V getter films by synchrotron radiation photoemission spectroscopy

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Cited by 6 publications
(4 citation statements)
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“…The change in XPS core level spectra is documented in Figure . The shift of the V2p, Ti2p, Zr3d states to lower binding energy is characteristic for the chemical reduction of the metal elements and a loss of surface metal–oxygen bonds, [ 72,73 ] which is traceable by the reduction of the O1s signal intensity (see Figure 4c,f). Furthermore, the states in the C1s spectra shift from ≈285 to ≈282.5 eV above 200 °C, induced by a transformation of hydrocarbon adsorbates on the reactive surface and formation of metal carbide bonds.…”
Section: Resultsmentioning
confidence: 99%
“…The change in XPS core level spectra is documented in Figure . The shift of the V2p, Ti2p, Zr3d states to lower binding energy is characteristic for the chemical reduction of the metal elements and a loss of surface metal–oxygen bonds, [ 72,73 ] which is traceable by the reduction of the O1s signal intensity (see Figure 4c,f). Furthermore, the states in the C1s spectra shift from ≈285 to ≈282.5 eV above 200 °C, induced by a transformation of hydrocarbon adsorbates on the reactive surface and formation of metal carbide bonds.…”
Section: Resultsmentioning
confidence: 99%
“…This was attributed to the critical role of the gas diffusion into the Ti film with higher porosity at the high activation temperature. The XPS depth profile of the Ti NEG films clearly demonstrated a higher atomic ratio of gas molecules for the sputtered Ti film at the middle and bottom sections compared to the top section [22][23][24]. This indicated that the sputtered Ti NEG film possessed a higher porosity, which was more advantageous for gas adsorption.…”
Section: Comparison Of Ti Neg Films By Evaporator and Sputtermentioning
confidence: 93%
“…Non-evaporable getter (NEG) films, due to their special microstructures for high foreign atom holding capacity and high reactivity with gas molecules, have become an essential component in situations where ultrahigh or extremely high vacuum is required. However, a passivation layer forms on the surface of this special material when exposed to air, which requires thermal vacuum activation prior to use. Research , on the composition of the passivation layer is critical to improving the activation performance and extending the lifetime of NEG films. X-ray photoelectron spectroscopy (XPS) and synchrotron radiation photoemission spectroscopy (SRPES) , are the dominant research approaches.…”
Section: Introductionmentioning
confidence: 99%
“…Research , on the composition of the passivation layer is critical to improving the activation performance and extending the lifetime of NEG films. X-ray photoelectron spectroscopy (XPS) and synchrotron radiation photoemission spectroscopy (SRPES) , are the dominant research approaches. This method facilitates an understanding of the formed compositional characteristics, but it lacks details and is not sufficient to gain insight into the passivation layer formation mechanism.…”
Section: Introductionmentioning
confidence: 99%