2015
DOI: 10.1155/2015/618279
|View full text |Cite
|
Sign up to set email alerts
|

Oxide Nanolayers in Stratified Samples Studied by X-Ray Resonant Raman Scattering at Grazing Incidence

Abstract: X-ray resonant Raman scattering is applied at grazing incidence conditions with the aim of discriminating and identifying chemical environment of iron in different layers of stratified materials using a low resolution energy dispersive system. The methodology allows for depth studies with nanometric resolution. Nanostratified samples of Fe oxides were studied at the Brazilian synchrotron facility (LNLS) using monochromatic radiation and an EDS setup. The measurements were carried out in grazing incident regime… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

0
3
0

Year Published

2018
2018
2023
2023

Publication Types

Select...
6

Relationship

1
5

Authors

Journals

citations
Cited by 7 publications
(3 citation statements)
references
References 29 publications
(29 reference statements)
0
3
0
Order By: Relevance
“…The analysis of the collected signal shows that hidden on the peak tails there is valuable information about the chemical environment of the atom under study [76]. During the last decade, several works have been published showing the first applications of a novel RIXS tool (named EDIXS) for the discrimination, determination and characterization of chemical environments in a variety of samples and irradiation geometries and even combined with other spectroscopic techniques [76][77][78][79][80][81][82][83][84][85][86]. Due to its versatility, EDIXS was applied in the typical 45 • -45 • setup for inspection of the material bulk, in total reflection for the study of the most external atomic layers of a sample, in grazing incidence used for depth resolved chemical speciation analysis and even in confocal setup to obtain chemical state information in a 3D regime, reaching nanometric spatial resolution.…”
Section: Resonant Inelastic X-ray Scatteringmentioning
confidence: 99%
“…The analysis of the collected signal shows that hidden on the peak tails there is valuable information about the chemical environment of the atom under study [76]. During the last decade, several works have been published showing the first applications of a novel RIXS tool (named EDIXS) for the discrimination, determination and characterization of chemical environments in a variety of samples and irradiation geometries and even combined with other spectroscopic techniques [76][77][78][79][80][81][82][83][84][85][86]. Due to its versatility, EDIXS was applied in the typical 45 • -45 • setup for inspection of the material bulk, in total reflection for the study of the most external atomic layers of a sample, in grazing incidence used for depth resolved chemical speciation analysis and even in confocal setup to obtain chemical state information in a 3D regime, reaching nanometric spatial resolution.…”
Section: Resonant Inelastic X-ray Scatteringmentioning
confidence: 99%
“…This feature offers also the possibility to perform optimum peak to background X-ray fluorescence (XRF) measurements under the external total reflection irradiation geometry (TXRF analysis), allowing the elemental analysis and characterization of trace and ultratrace quantities of particles and of dried residues deposited on smooth surfaces, such as silicon wafers . Several papers have been published demonstrating the potentiality of external total reflection combined with different spectroscopic techniques, such as XRF, EXAFS, , and even inelastic X-ray scattering (IXS) at grazing incidence conditions. , Applications of RIXS in total reflection geometry have been already reported using an energy dispersive system, showing a successful discrimination and characterization of arsenic species in water samples, and of different chemical compounds contained in nanolayers …”
Section: X-ray Spectrochemical Techniquementioning
confidence: 99%
“…26 The versatility of this technique can be extended to irradiation geometries and experimental setups. Several results were reported in the last few years regarding the application of EDIXS in different geometries with the aim of highlighting specic sample information: 45-45 for bulk inspections, 25,[27][28][29][30] total reection for surface analysis, 26,31 grazing incidence for surface studies [32][33][34] and even confocal setups for 3D explorations. 35 It is interesting to note that EDIXS has already been successfully employed for the discrimination of multilayered metallic samples.…”
Section: Introductionmentioning
confidence: 99%