2019
DOI: 10.1002/ange.201907117
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Oxidation of Reduced Ceria by Incorporation of Hydrogen

Abstract: The interaction of hydrogen with reduced ceria (CeO 2Àx )p owders and CeO 2Àx (111) thin films was studied using several characterization techniques including TEM, XRD,LEED,XPS,RPES,EELS,ESR, and TDS.The results clearly indicate that both in reduced ceria powders as well as in reduced single crystal ceria films hydrogen may form hydroxyls at the surface and hydride species belowt he surface.T he formation of hydrides is clearly linked to the presence of oxygen vacancies and is accompanied by the transfer of an… Show more

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Cited by 29 publications
(22 citation statements)
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“…The dashed lines shown in Figure c show the characteristic peaks for a Ce 3+ state. The degree of surface reduction [Ce 3+ /(Ce 4+ +Ce 3+ )] is estimated to be around 20 %, which is equivalent to about 10 % of the oxygen sites being vacant (note that one oxygen vacancy creates two Ce 3+ ions) . The weak signal at 531.8 eV in the O 1s XP spectrum of CeO 2− x (111) was previously attributed to the oxygen anions near the oxygen vacancy (Figure d) .…”
Section: Figurementioning
confidence: 90%
See 1 more Smart Citation
“…The dashed lines shown in Figure c show the characteristic peaks for a Ce 3+ state. The degree of surface reduction [Ce 3+ /(Ce 4+ +Ce 3+ )] is estimated to be around 20 %, which is equivalent to about 10 % of the oxygen sites being vacant (note that one oxygen vacancy creates two Ce 3+ ions) . The weak signal at 531.8 eV in the O 1s XP spectrum of CeO 2− x (111) was previously attributed to the oxygen anions near the oxygen vacancy (Figure d) .…”
Section: Figurementioning
confidence: 90%
“…Both oxidized stoichiometric CeO 2 (111) and reduced CeO 2− x (111) ceria films were fabricated on Ru(0001) substrates . The surface crystal structures and the electronic structures of these ceria films were characterized by low‐energy electron diffraction (LEED) and X‐ray photoelectron spectroscopy (XPS; Figure a–d).…”
Section: Figurementioning
confidence: 99%
“…Generally speaking, the existence of oxygen vacancy is accompanied by the change of valence of metal elements (the formation of low‐valent metal ions), so the existence and semi‐quantitative analysis of surface oxygen vacancies can be judged and calculated by XPS datum. [ 63 ]…”
Section: Characterization Of Oxygen Defects In Nanostructured Metal Oxidesmentioning
confidence: 99%
“…Sowohl vollständig oxidierte (d.h. stöchiometrische) CeO 2 (111)‐, als auch reduzierte CeO 2− x (111)‐Filme wurden auf einem Ru(0001)‐Substrat gewachsen . Die Oberflächenkristallstruktur und elektronische Struktur dieser Ceroxidfilme wurde jeweils durch Low‐Energy‐Electron‐Diffraction (LEED) und Röntgen‐Photoelektronenspektroskopie (XPS) charakterisiert (siehe Abbildung a–d).…”
Section: Figureunclassified
“…20 % geschätzt, was einer Sauerstoffleerstellenkonzentration von ≈10 % bezüglich aller Sauerstoffpositionen von CeO 2 (111) entspricht. (Es sei hier darauf hingewiesen, dass die Bildung einer Sauerstoffleerstelle auch zwei Ce 3+ ‐Ionen erzeugt) . Das schwache Signal bei 531.8 eV im O 1s XP‐Spektrum von CeO 2− x (111) wurde bisher Sauerstoffanionen in der Nähe einer Sauerstoffleerstelle zugeschrieben (Abbildung d) .…”
Section: Figureunclassified