Oxidation of aluminum studied by secondary electron emission

Benka, O.; Steinbatz, M.

doi:10.1016/s0039-6028(02)02561-x

Cited by 22 publications

(13 citation statements)

References 19 publications

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“…This model is also supported by others SEY measurements, with a 3 keV electron beam energy, of an evaporated Al and grown Al 2 O 3 thin film [14] [15]. The SEY, at 3 keV, of an Al thin film exposed to oxygen shows a dip, and this is independent of the oxygen pressure in the vacuum chamber [15].…”

Section: Explaining the Dip In The Sey Curvesupporting

confidence: 75%

Electron Conditioning of Technical Aluminium Surfaces: Effect on the Secondary Electron Yield

Pimpec¹

2004

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Section: Explaining the Dip In The Sey Curvesupporting

confidence: 75%

Electron Conditioning of Technical Aluminium Surfaces: Effect on the Secondary Electron Yield

Pimpec¹

2004

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“…This model is also supported by others SEY measurements, with a 3 keV electron beam energy, of an evaporated Al and grown Al 2 O 3 thin film [12] [13]. The SEY, at 3 keV, of an Al thin film exposed to oxygen shows a dip, and this is independent of the oxygen pressure in the vacuum chamber [13]. For comparison, no dip is seen on copper because copper oxide (Cu 2 O) has a lower SEY than the pure Cu [14] [2].…”

Section: Explaining the Dip In The Sey Curvesupporting

confidence: 82%

Electron Conditioning of Technical Aluminium Surfaces

Pimpec¹

2004

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This note documents a set of expressions used to explore the issue of whether or not it is reasonable to consider a conventional positron source for a Tesla formatted beam. The critical issue is that of energy deposition in the conversion target and the comparison of the induced stress with the ultimate tensile strength of the target material. Since the length of the incident beam pulse is large in comparison to the ratio of beam size to the speed of sound, the concurrent pressure pulse dissipates in a time short compared to the overall pulse duration and one is left with only the Abstract: The effect of electron conditioning on commercially aluminium alloys 1100 and 6063 were investigated. Contrary to the assumption that electron conditioning, if performed long enough, can reduce and stabilize the SEY at approximately 1.1, the SEY of aluminium did not go lower than 1.8. In fact, it reincreases with continued electron exposure dose. AbstractThe effect of electron conditioning on commercially aluminium alloys 1100 and 6063 were investigated. Contrary to the assumption that electron conditioning, if performed long enough, can reduce and stabilize the SEY at approximatively 1.1, the SEY of aluminium did not go lower than 1.8. In fact, it reincreases with continued electron exposure dose.

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“…On starting to add the small amount of oxygen to the working gas mixture an increase of magnetron voltage takes place due to oxygen chemisorption [35] (see Figure 3b). Since the O atom, upon an impact of an energetic ion, will contribute less to electron emission than an Al atom, the presence of adsorbed oxygen atoms will lower overall electron emission yield [36]. This in turn results in the increase of magnetron voltage.…”

Section: Al and Al X O Y Nanoparticlesmentioning

confidence: 99%